An automatic macro program for radio frequency MOSFET characteristics analysis

C. Y. Su; S. J. Chang; L. P. Chen; Y. P. Ho; G. W. Huang; D. C. Lin; B. M. Tseng; H. Y. Lee; J. F. Kuan; Y. M. Deng; Kuei-Ann Wen; C. Y. Chang

An automatic macro program for radio frequency MOSFET characteristics analysis

C. Y. Su^*, S. J. Chang, L. P. Chen, Y. P. Ho, G. W. Huang, D. C. Lin, B. M. Tseng, H. Y. Lee, J. F. Kuan, Y. M. Deng, Kuei-Ann Wen, C. Y. Chang

^*Corresponding author for this work

Research output: Contribution to specialist publication › Article

Abstract

The parameter extraction language (PEL) in Agilent IC-CAP software is used to develop an automatic macro program for the analysis of the characteristics of RF MOSFETs. By using this powerful macro program, the time spent on the measurement of the MOSFET characteristics and the related analysis is effectively reduced. This macro program permits a fast and accurate method to obtain the DC and RF characteristics of MOSFETs with different device geometries and operating conditions. It is also suitable for high volume measurements and analyses of MOSFETs, and provides a solid foundation for RF circuit design.

Original language	English
Number of pages	5
Volume	44
No	10
Specialist publication	Microwave Journal
State	Published - 1 Oct 2001

Cite this

@misc{563f793b3cdf47a498366c204b99424e,

title = "An automatic macro program for radio frequency MOSFET characteristics analysis",

abstract = "The parameter extraction language (PEL) in Agilent IC-CAP software is used to develop an automatic macro program for the analysis of the characteristics of RF MOSFETs. By using this powerful macro program, the time spent on the measurement of the MOSFET characteristics and the related analysis is effectively reduced. This macro program permits a fast and accurate method to obtain the DC and RF characteristics of MOSFETs with different device geometries and operating conditions. It is also suitable for high volume measurements and analyses of MOSFETs, and provides a solid foundation for RF circuit design.",

author = "Su, {C. Y.} and Chang, {S. J.} and Chen, {L. P.} and Ho, {Y. P.} and Huang, {G. W.} and Lin, {D. C.} and Tseng, {B. M.} and Lee, {H. Y.} and Kuan, {J. F.} and Deng, {Y. M.} and Kuei-Ann Wen and Chang, {C. Y.}",

year = "2001",

month = oct,

day = "1",

language = "English",

volume = "44",

journal = "Microwave Journal",

issn = "0192-6225",

publisher = "Horizon House",

}

TY - GEN

T1 - An automatic macro program for radio frequency MOSFET characteristics analysis

AU - Su, C. Y.

AU - Chang, S. J.

AU - Chen, L. P.

AU - Ho, Y. P.

AU - Huang, G. W.

AU - Lin, D. C.

AU - Tseng, B. M.

AU - Lee, H. Y.

AU - Kuan, J. F.

AU - Deng, Y. M.

AU - Wen, Kuei-Ann

AU - Chang, C. Y.

PY - 2001/10/1

Y1 - 2001/10/1

N2 - The parameter extraction language (PEL) in Agilent IC-CAP software is used to develop an automatic macro program for the analysis of the characteristics of RF MOSFETs. By using this powerful macro program, the time spent on the measurement of the MOSFET characteristics and the related analysis is effectively reduced. This macro program permits a fast and accurate method to obtain the DC and RF characteristics of MOSFETs with different device geometries and operating conditions. It is also suitable for high volume measurements and analyses of MOSFETs, and provides a solid foundation for RF circuit design.

AB - The parameter extraction language (PEL) in Agilent IC-CAP software is used to develop an automatic macro program for the analysis of the characteristics of RF MOSFETs. By using this powerful macro program, the time spent on the measurement of the MOSFET characteristics and the related analysis is effectively reduced. This macro program permits a fast and accurate method to obtain the DC and RF characteristics of MOSFETs with different device geometries and operating conditions. It is also suitable for high volume measurements and analyses of MOSFETs, and provides a solid foundation for RF circuit design.

UR - http://www.scopus.com/inward/record.url?scp=0035485069&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:0035485069

SN - 0192-6225

VL - 44

JO - Microwave Journal

JF - Microwave Journal

ER -

An automatic macro program for radio frequency MOSFET characteristics analysis

Abstract

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