An assessment of single-electron effects in multiple-gate SOI MOSFETs with 1.6-nm gate oxide near room temperature

  • Wei Lee*
  • , Pin Su
  • , Hou Yu Chen
  • , Chang Yun Chang
  • , Ke Wei Su
  • , Sally Liu
  • , Fu Liang Yang
    • *Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    Fingerprint

    Dive into the research topics of 'An assessment of single-electron effects in multiple-gate SOI MOSFETs with 1.6-nm gate oxide near room temperature'. Together they form a unique fingerprint.