TY - GEN
T1 - An area-efficient parallel turbo decoder based on contention free algorithm
AU - Tseng, Kai Hsin
AU - Chuang, Hsiang Tsung
AU - Tseng, Shao Yen
AU - Fang, Wai-Chi
PY - 2009
Y1 - 2009
N2 - In this paper, a contention free algorithm for solving memory collision problem of parallel Turbo decoder architecture using the simulated annealing algorithm is presented. Furthermore, we proposed two area-efficient extrinsic memory schemes based on the parallel contention free Turbo decoder. One of the proposed schemes employs only multiple single port memories with one temporary buffer instead of the original dual port or two port memories and the other scheme further employs an additional non-linear extrinsic mapping architecture. The proposed schemes lead to approximately 37% and 46% memory area reduction, respectively, for 16-parallel Turbo decoder in comparison to the conventional dual port memory scheme under the UMC 0.13-μim CMOS process.
AB - In this paper, a contention free algorithm for solving memory collision problem of parallel Turbo decoder architecture using the simulated annealing algorithm is presented. Furthermore, we proposed two area-efficient extrinsic memory schemes based on the parallel contention free Turbo decoder. One of the proposed schemes employs only multiple single port memories with one temporary buffer instead of the original dual port or two port memories and the other scheme further employs an additional non-linear extrinsic mapping architecture. The proposed schemes lead to approximately 37% and 46% memory area reduction, respectively, for 16-parallel Turbo decoder in comparison to the conventional dual port memory scheme under the UMC 0.13-μim CMOS process.
UR - http://www.scopus.com/inward/record.url?scp=77950638466&partnerID=8YFLogxK
U2 - 10.1109/VDAT.2009.5158130
DO - 10.1109/VDAT.2009.5158130
M3 - Conference contribution
AN - SCOPUS:77950638466
SN - 9781424427826
T3 - 2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09
SP - 203
EP - 206
BT - 2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09
T2 - 2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09
Y2 - 28 April 2009 through 30 April 2009
ER -