Advancements in single-crystal silicon with elevated-laser-liquid-phase-epitaxy (ELLPE) for monolithic 3D ICs

Bo Jheng Shih*, Yu Ming Pan, Hao Tung Chung, Nein Chih Lin, Chih Chao Yang, Po Tsang Huang, Huang Chung Cheng, Chang Hong Shen, Jia Min Shieh, Wen Fa Wu, Kuan Neng Chen, Chenming Hu

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

In this study, we present a low thermal budget elevated-laser-liquid-phase-epitaxy technique designed for the precise fabrication of single-crystal islands (SCIs) intended for use in middle-end-of-line (MEOL) FinFETs. Each of these SCIs features a (100) orientation tended from Si seeding structure and is successfully integrated as channel materials in the MEOL circuit of a monolithic 3D IC (3DIC). This technique effectively mitigates the typical performance disparities associated with poly-Si channel materials in upper tiers, addressing a significant challenge in advanced electronic device fabrication and potentially enhancing the performance and reliability of MEOL FinFETs in monolithic 3DIC.

Original languageEnglish
Article number04SP30
JournalJapanese journal of applied physics
Volume63
Issue number4
DOIs
StatePublished - 1 Apr 2024

Keywords

  • elevated-laser-liquid-phase-epitaxy technique
  • laser recrystallization
  • monolithic 3DIC

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