Abstract
This article investigates the adhesion properties between the polyimide layers and the Ti/Cu layer after the electroplating process. The adhesion strength was evaluated by the four-point bending system, and the influence factors were confirmed by using different electroplating times and currents. The fracture interface after the four-point bending measurement was characterized, and the interface spectrum between the polyimide and the Ti/Cu layer was analyzed. The results showed that the modified polyimide-like material has better adhesion performance than the conventional polyimide. Moreover, the mechanism of degradation was proposed. As a result, the modified polyimide-like material can be applied in electroplating, a redistribution layer (RDL) formation, and packaging at the back-end-of-line processes.
Original language | English |
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Article number | 8843892 |
Pages (from-to) | 168-175 |
Number of pages | 8 |
Journal | IEEE Transactions on Components, Packaging and Manufacturing Technology |
Volume | 10 |
Issue number | 1 |
DOIs | |
State | Published - Jan 2020 |
Keywords
- Adhesion
- X-ray photoelectron spectroscopy (XPS)
- electroplating
- polyimide