Abstract
In this study, we activated p-type GaN in a pure oxygen ambient by rapid thermal annealing. The sheet resistance of p-type GaN was greatly reduced from > 107 Ω/□ to 7.06 × 104 Ω/□ after annealing in oxygen ambient at 500°C. The photoluminescence intensity of blue emission increased by one order of magnitude compared to the as-grown sample. Moreover, the sheet resistance of p-type GaN annealed in pure oxygen ambient is lower than that of p-type GaN annealed in nitrogen ambient. The carrier concentrations of the samples annealed in oxygen ambient are higher than those annealed in nitrogen ambient. The better activation of p-type GaN in oxygen ambient is due to the higher activity of oxygen than that of nitrogen. Oxygen would remove hydrogen that passivates Mg atoms by forming H2O at a lower temperature.
Original language | English |
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Pages (from-to) | L495-L497 |
Journal | Japanese Journal of Applied Physics, Part 2: Letters |
Volume | 40 |
Issue number | 5 B |
DOIs | |
State | Published - 15 May 2001 |
Keywords
- Activation
- Hall measurement
- Hydrogen
- Nitrogen ambient
- Oxygen ambient
- p-type GaN
- Photoluminescence
- Rapid thermal annealing