Abnormal positive bias stress instability of In-Ga-Zn-O thin-film transistors with low-temperature Al2O3 gate dielectric

Yu Hong Chang, Ming Jiue Yu, Ruei Ping Lin, Chih Pin Hsu, Tuo-Hung Hou*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

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Physics & Astronomy