TY - GEN
T1 - A third-order continuous-time sigma-delta modulator for bluetooth
AU - Yang, Wen Lin
AU - Hsieh, Wen Hung
AU - Hung, Chung-Chih
PY - 2009/12/1
Y1 - 2009/12/1
N2 - This paper presents the design of a third-order continuous-time (CT) single-bit active-RC sigma-delta (ΣΔ) modulator for Bluetooth application. Through the use of the architecture, cascade of resonators with distributed feedback (CRFB), the signal bandwidth can be improved without increasing the order of the modulator. All integrators are implemented by active-RC type to have better linearity. Furthermore, in order to reduce the effect of the clock jitter, the feedback digital-to-analog converter (DAC) shape is realized by non-return-to-zero (NRZ). The modulator is designed in a standard digital 0.18μm CMOS process with a chip area of 1.32×1.23 mm2. The measurement results show that the modulator achieves 56.8dB SNDR and 60dB dynamic range over 1MHz signal bandwidth, consuming 22.2mW at 1.8V supply.
AB - This paper presents the design of a third-order continuous-time (CT) single-bit active-RC sigma-delta (ΣΔ) modulator for Bluetooth application. Through the use of the architecture, cascade of resonators with distributed feedback (CRFB), the signal bandwidth can be improved without increasing the order of the modulator. All integrators are implemented by active-RC type to have better linearity. Furthermore, in order to reduce the effect of the clock jitter, the feedback digital-to-analog converter (DAC) shape is realized by non-return-to-zero (NRZ). The modulator is designed in a standard digital 0.18μm CMOS process with a chip area of 1.32×1.23 mm2. The measurement results show that the modulator achieves 56.8dB SNDR and 60dB dynamic range over 1MHz signal bandwidth, consuming 22.2mW at 1.8V supply.
UR - http://www.scopus.com/inward/record.url?scp=77950647951&partnerID=8YFLogxK
U2 - 10.1109/VDAT.2009.5158141
DO - 10.1109/VDAT.2009.5158141
M3 - Conference contribution
AN - SCOPUS:77950647951
SN - 9781424427826
T3 - 2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09
SP - 247
EP - 250
BT - 2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09
T2 - 2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09
Y2 - 28 April 2009 through 30 April 2009
ER -