A Single-Inductor-Triple-Output Buck DC-DC Converter With Electromagnetic Gated Low Dropouts for Higher Resistance to Electromagnetic and Power Side-Channel Attacks With 3B Minimum Traces to Disclosure Improvement in Internet of Things Applications

Ya Ting Hsu; Kai Cheng Chung; Yu Jheng Ouyang; Ke Horng Chen; Kuo Lin Zheng; Ying Hsi Lin; Shian Ru Lin; Tsung Yen Tsai

doi:10.1109/LSSC.2023.3260952

A Single-Inductor-Triple-Output Buck DC-DC Converter With Electromagnetic Gated Low Dropouts for Higher Resistance to Electromagnetic and Power Side-Channel Attacks With 3B Minimum Traces to Disclosure Improvement in Internet of Things Applications

Ya Ting Hsu, Kai Cheng Chung, Yu Jheng Ouyang, Ke Horng Chen^*, Kuo Lin Zheng, Ying Hsi Lin, Shian Ru Lin, Tsung Yen Tsai

^*Corresponding author for this work

Department of Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

The security protection of the Internet of Things urges the design of low electromagnetic interference (EMI) and small power signature in power chips. To achieve high security, small chip area, and high efficiency, this letter proposes a single-inductor-triple-output (SITO) buck dc-dc converter with electromagnetic (EM) gated low dropouts (LDOs) to reduce the EM-leaked signature. Experimental results show that the peak value of EMI noise can be reduced from 88.44 to 54.92 dB mV, complying with EN 55032 Class B specifications. In addition, it can achieve 3 billion (B) minimum traces to disclosure (MTD) under power side-channel attack, which is at least three times improvement compared to prior-arts.

Original language	English
Pages (from-to)	89-92
Number of pages	4
Journal	IEEE Solid-State Circuits Letters
Volume	6
DOIs	https://doi.org/10.1109/LSSC.2023.3260952
State	Published - 2023

Keywords

Advanced encryption standard (AES)
digital low dropout voltage regulator (DLDO)
electromagnetic (EM)-leaked signature
electromagnetic interference (EMI)
hardware security
side-channel attack (SCA)
true random number generator (TRNG)

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Hsu, Y. T., Chung, K. C., Ouyang, Y. J., Chen, K. H., Zheng, K. L., Lin, Y. H., Lin, S. R., & Tsai, T. Y. (2023). A Single-Inductor-Triple-Output Buck DC-DC Converter With Electromagnetic Gated Low Dropouts for Higher Resistance to Electromagnetic and Power Side-Channel Attacks With 3B Minimum Traces to Disclosure Improvement in Internet of Things Applications. IEEE Solid-State Circuits Letters, 6, 89-92. https://doi.org/10.1109/LSSC.2023.3260952

Hsu, Ya Ting ; Chung, Kai Cheng ; Ouyang, Yu Jheng et al. / A Single-Inductor-Triple-Output Buck DC-DC Converter With Electromagnetic Gated Low Dropouts for Higher Resistance to Electromagnetic and Power Side-Channel Attacks With 3B Minimum Traces to Disclosure Improvement in Internet of Things Applications. In: IEEE Solid-State Circuits Letters. 2023 ; Vol. 6. pp. 89-92.

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title = "A Single-Inductor-Triple-Output Buck DC-DC Converter With Electromagnetic Gated Low Dropouts for Higher Resistance to Electromagnetic and Power Side-Channel Attacks With 3B Minimum Traces to Disclosure Improvement in Internet of Things Applications",

abstract = "The security protection of the Internet of Things urges the design of low electromagnetic interference (EMI) and small power signature in power chips. To achieve high security, small chip area, and high efficiency, this letter proposes a single-inductor-triple-output (SITO) buck dc-dc converter with electromagnetic (EM) gated low dropouts (LDOs) to reduce the EM-leaked signature. Experimental results show that the peak value of EMI noise can be reduced from 88.44 to 54.92 dB mV, complying with EN 55032 Class B specifications. In addition, it can achieve 3 billion (B) minimum traces to disclosure (MTD) under power side-channel attack, which is at least three times improvement compared to prior-arts.",

keywords = "Advanced encryption standard (AES), digital low dropout voltage regulator (DLDO), electromagnetic (EM)-leaked signature, electromagnetic interference (EMI), hardware security, side-channel attack (SCA), true random number generator (TRNG)",

author = "Hsu, {Ya Ting} and Chung, {Kai Cheng} and Ouyang, {Yu Jheng} and Chen, {Ke Horng} and Zheng, {Kuo Lin} and Lin, {Ying Hsi} and Lin, {Shian Ru} and Tsai, {Tsung Yen}",

note = "Publisher Copyright: {\textcopyright} 2018 IEEE.",

year = "2023",

doi = "10.1109/LSSC.2023.3260952",

language = "English",

volume = "6",

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journal = "IEEE Solid-State Circuits Letters",

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Hsu, YT, Chung, KC, Ouyang, YJ, Chen, KH, Zheng, KL, Lin, YH, Lin, SR & Tsai, TY 2023, 'A Single-Inductor-Triple-Output Buck DC-DC Converter With Electromagnetic Gated Low Dropouts for Higher Resistance to Electromagnetic and Power Side-Channel Attacks With 3B Minimum Traces to Disclosure Improvement in Internet of Things Applications', IEEE Solid-State Circuits Letters, vol. 6, pp. 89-92. https://doi.org/10.1109/LSSC.2023.3260952

A Single-Inductor-Triple-Output Buck DC-DC Converter With Electromagnetic Gated Low Dropouts for Higher Resistance to Electromagnetic and Power Side-Channel Attacks With 3B Minimum Traces to Disclosure Improvement in Internet of Things Applications. / Hsu, Ya Ting; Chung, Kai Cheng; Ouyang, Yu Jheng et al.
In: IEEE Solid-State Circuits Letters, Vol. 6, 2023, p. 89-92.

Research output: Contribution to journal › Article › peer-review

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T1 - A Single-Inductor-Triple-Output Buck DC-DC Converter With Electromagnetic Gated Low Dropouts for Higher Resistance to Electromagnetic and Power Side-Channel Attacks With 3B Minimum Traces to Disclosure Improvement in Internet of Things Applications

AU - Hsu, Ya Ting

AU - Chung, Kai Cheng

AU - Ouyang, Yu Jheng

AU - Chen, Ke Horng

AU - Zheng, Kuo Lin

AU - Lin, Ying Hsi

AU - Lin, Shian Ru

AU - Tsai, Tsung Yen

PY - 2023

Y1 - 2023

N2 - The security protection of the Internet of Things urges the design of low electromagnetic interference (EMI) and small power signature in power chips. To achieve high security, small chip area, and high efficiency, this letter proposes a single-inductor-triple-output (SITO) buck dc-dc converter with electromagnetic (EM) gated low dropouts (LDOs) to reduce the EM-leaked signature. Experimental results show that the peak value of EMI noise can be reduced from 88.44 to 54.92 dB mV, complying with EN 55032 Class B specifications. In addition, it can achieve 3 billion (B) minimum traces to disclosure (MTD) under power side-channel attack, which is at least three times improvement compared to prior-arts.

AB - The security protection of the Internet of Things urges the design of low electromagnetic interference (EMI) and small power signature in power chips. To achieve high security, small chip area, and high efficiency, this letter proposes a single-inductor-triple-output (SITO) buck dc-dc converter with electromagnetic (EM) gated low dropouts (LDOs) to reduce the EM-leaked signature. Experimental results show that the peak value of EMI noise can be reduced from 88.44 to 54.92 dB mV, complying with EN 55032 Class B specifications. In addition, it can achieve 3 billion (B) minimum traces to disclosure (MTD) under power side-channel attack, which is at least three times improvement compared to prior-arts.

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KW - digital low dropout voltage regulator (DLDO)

KW - electromagnetic (EM)-leaked signature

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KW - true random number generator (TRNG)

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ER -

Hsu YT, Chung KC, Ouyang YJ, Chen KH, Zheng KL, Lin YH et al. A Single-Inductor-Triple-Output Buck DC-DC Converter With Electromagnetic Gated Low Dropouts for Higher Resistance to Electromagnetic and Power Side-Channel Attacks With 3B Minimum Traces to Disclosure Improvement in Internet of Things Applications. IEEE Solid-State Circuits Letters. 2023;6:89-92. doi: 10.1109/LSSC.2023.3260952

A Single-Inductor-Triple-Output Buck DC-DC Converter With Electromagnetic Gated Low Dropouts for Higher Resistance to Electromagnetic and Power Side-Channel Attacks With 3B Minimum Traces to Disclosure Improvement in Internet of Things Applications

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Keywords

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