Abstract
A simple processing technology for oxide confined vertical-cavity surface-emitting lasers (VCSELs) fabrication is reported in this article. Results of the burn-in test up to the present-day show that the high temperature lifetime of the fabricated devices exceeded 70:00h. The eye diagrams show that the devices can be modulated up to 10Gbps.
Original language | English |
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Pages (from-to) | 101-104 |
Number of pages | 4 |
Journal | Materials Science and Engineering B: Solid-State Materials for Advanced Technology |
Volume | 106 |
Issue number | 1 |
DOIs | |
State | Published - 15 Jan 2004 |
Keywords
- Far field pattern
- L-I-V
- Life test
- VCSEL