A series stacked FinFET structure for digital low dropout regulators with minimum energy point technique for 37.5% energy reduction in Cortex M0 processor

Nan Hsiung Tseng, Bo Kuan Wu, Tzu Ping Huang, Cheng Yen Lee, Ke Horng Chen, Ying Hsi Lin, Shian Ru Lin, Tsung Yen Tsai

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

The series stacked (SS) FinFET structure is used in digital low dropout (DLDO) regulators to withstand high input voltages and implement dynamic voltage scaling (DVS) technique with minimum energy point (MEP) technique. Through an additional delay consideration in MEP, both energy reduction and performance of the Cortex M0 processor can achieve 34.5pJ/cycle at 0.5V. Maximum energy reduction is about 37.5% and the supplying voltage varies from 0.4V to 0.775V with a search time of 2.5μs for each voltage step. The proposed SS-DLDO has fast settling time and low output voltage ripple of 1.5μs and 5mV, respectively.

Original languageEnglish
Title of host publication2021 IEEE International Symposium on Circuits and Systems, ISCAS 2021 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728192017
DOIs
StatePublished - May 2021
Event53rd IEEE International Symposium on Circuits and Systems, ISCAS 2021 - Daegu, Korea, Republic of
Duration: 22 May 202128 May 2021

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
Volume2021-May
ISSN (Print)0271-4310

Conference

Conference53rd IEEE International Symposium on Circuits and Systems, ISCAS 2021
Country/TerritoryKorea, Republic of
CityDaegu
Period22/05/2128/05/21

Keywords

  • Dynamic voltage scaling (DVS) technique
  • Minimum energy point (MEP) technique
  • Series stacked (SS) FinFET

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