A novel way of LTPS model extraction with hysteresis and transient current analysis

Chen Hao Kuo; Yung Sheng Tsai; Ching Chieh Tseng; Chee Wai Lau; Chun Yen Liu; Hannibal Wang; Leon Huang; Scott Lin; You Pang Wei; Po-Tsun Liu

doi:10.1002/sdtp.10022

A novel way of LTPS model extraction with hysteresis and transient current analysis

Chen Hao Kuo
, Yung Sheng Tsai
, Ching Chieh Tseng
, Chee Wai Lau
, Chun Yen Liu
, Hannibal Wang
, Leon Huang
, Scott Lin
, You Pang Wei
, Po-Tsun Liu

Department of Photonics

Research output: Contribution to journal › Conference article › peer-review

10 Scopus citations

Abstract

Time-sampling measurements are used in this paper to build time dependent L TPS TFT current model The device model that considers bias and time dependent threshold voltage (V_th) shift and mobility degradation is implemented in Eldo through GUDM for simulating a pixel circuit as an indicator of panel performance.

Original language	English
Pages (from-to)	1123-1126
Number of pages	4
Journal	Digest of Technical Papers - SID International Symposium
Volume	46
Issue number	Book 3
DOIs	https://doi.org/10.1002/sdtp.10022
State	Published - 1 Jun 2015
Event	2015 SID International Symposium - San Jose, United States Duration: 2 Jun 2015 → 3 Jun 2015

Keywords

Eldo
GUDM
LTPS
Time-sampling measurement
Transient current
V degradation

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10.1002/sdtp.10022

Cite this

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title = "A novel way of LTPS model extraction with hysteresis and transient current analysis",

abstract = "Time-sampling measurements are used in this paper to build time dependent L TPS TFT current model The device model that considers bias and time dependent threshold voltage (Vth) shift and mobility degradation is implemented in Eldo through GUDM for simulating a pixel circuit as an indicator of panel performance.",

keywords = "Eldo, GUDM, LTPS, Time-sampling measurement, Transient current, V degradation",

author = "Kuo, \{Chen Hao\} and Tsai, \{Yung Sheng\} and Tseng, \{Ching Chieh\} and Lau, \{Chee Wai\} and Liu, \{Chun Yen\} and Hannibal Wang and Leon Huang and Scott Lin and Wei, \{You Pang\} and Po-Tsun Liu",

year = "2015",

month = jun,

day = "1",

doi = "10.1002/sdtp.10022",

language = "English",

volume = "46",

pages = "1123--1126",

journal = "Digest of Technical Papers - SID International Symposium",

issn = "0097-966X",

publisher = "John Wiley and Sons Inc.",

number = "Book 3",

note = "2015 SID International Symposium ; Conference date: 02-06-2015 Through 03-06-2015",

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T1 - A novel way of LTPS model extraction with hysteresis and transient current analysis

AU - Kuo, Chen Hao

AU - Tsai, Yung Sheng

AU - Tseng, Ching Chieh

AU - Lau, Chee Wai

AU - Liu, Chun Yen

AU - Wang, Hannibal

AU - Huang, Leon

AU - Lin, Scott

AU - Wei, You Pang

AU - Liu, Po-Tsun

PY - 2015/6/1

Y1 - 2015/6/1

N2 - Time-sampling measurements are used in this paper to build time dependent L TPS TFT current model The device model that considers bias and time dependent threshold voltage (Vth) shift and mobility degradation is implemented in Eldo through GUDM for simulating a pixel circuit as an indicator of panel performance.

AB - Time-sampling measurements are used in this paper to build time dependent L TPS TFT current model The device model that considers bias and time dependent threshold voltage (Vth) shift and mobility degradation is implemented in Eldo through GUDM for simulating a pixel circuit as an indicator of panel performance.

KW - Eldo

KW - GUDM

KW - LTPS

KW - Time-sampling measurement

KW - Transient current

KW - V degradation

UR - https://www.scopus.com/pages/publications/84962678159

U2 - 10.1002/sdtp.10022

DO - 10.1002/sdtp.10022

M3 - Conference article

AN - SCOPUS:84962678159

SN - 0097-966X

VL - 46

SP - 1123

EP - 1126

JO - Digest of Technical Papers - SID International Symposium

JF - Digest of Technical Papers - SID International Symposium

IS - Book 3

T2 - 2015 SID International Symposium

Y2 - 2 June 2015 through 3 June 2015

ER -

A novel way of LTPS model extraction with hysteresis and transient current analysis

Abstract

Keywords

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