A novel test flow for one-time-programming applications of NROM technology

Ching Yu Chin*, Yao Te Tsout, Chi Min Chang, Chia-Tso Chao

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Scopus citations


The NROM technology is an emerging non-volatilememory technology providing high data density with low fabrication cost. In this paper, we propose a novel test flow for the one-time-programming (OTP) applications using the NROM bit cells. Unlike the conventional test flow, the proposed flow applies the repair analysis in its package testing instead of in its wafer testing, and hence creates a chance for reusing the bit cells originally identified as a defect to represent the value in the OTP application. Thus, the proposed test flow can reduce the number of bit cells to be repaired and further improve the yield. Also, we propose an efficient and effective estimation scheme to predict the probability of a part being successfully repaired before packaged. This estimation can be used to determine whether a part should be packaged, such that the total profit of the proposed test flow can be optimized. A series ofexperiments are conducted to demonstrate the effectiveness, efficiency, and feasibility ofthe proposed test flow.

Original languageEnglish
Title of host publicationInternational Test Conference, ITC 2009 - Proceedings
StatePublished - 15 Dec 2009
EventInternational Test Conference, ITC 2009 - Austin, TX, United States
Duration: 1 Nov 20096 Nov 2009

Publication series

NameProceedings - International Test Conference
ISSN (Print)1089-3539


ConferenceInternational Test Conference, ITC 2009
Country/TerritoryUnited States
CityAustin, TX


Dive into the research topics of 'A novel test flow for one-time-programming applications of NROM technology'. Together they form a unique fingerprint.

Cite this