A Novel Physical Unclonable Function: NBTI-PUF Realized by Random Trap Fluctuation (RTF) Enhanced True Randomness in 14 nm FinFET Platform

L. C. Lin, E. R. Hsieh*, T. C. Kao, M. Y. Lee, J. K. Chang, J. C. Guo, Steve S. Chung, T. P. Chen, S. A. Huang, T. J. Chen, O. Cheng

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

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