A Novel Multicategory Defect Detection Method Based on the Convolutional Neural Network Method for TFT-LCD Panels

Yung Chia Chang, Kuei Hu Chang*, Hsien Mi Meng, Hung Chih Chiu

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

Defects on thin film transistor liquid crystal display (TFT-LCD) panel could be divided into either macro-or microdefects, depending on if they are easy to be detected by the naked eye or not. There have been abundant studies discussing the identification of macrodefects but very few on microones. This study proposed a multicategory classification model using a convolutional neural network model to work with automatic optical inspection (AOI) for identifying defective pixels on the TFT-LCD panel. Since the number of nondefective pixels outnumbered the defective ones, there exists a very serious class-imbalanced problem. To deal with that, this study designed a special training strategy that worked with data augmentation to increase the effectiveness of the proposed model. Actual panel images provided by a mobile manufacturer in Taiwan are used to demonstrate the efficiency and effectiveness of the proposed approach. After validation, the model constructed by this study had 98.9% total prediction accuracy and excellent specificity and sensitivity. The model could finish the detection and classification process automatically to replace the human inspection.

Original languageEnglish
Article number6505372
JournalMathematical Problems in Engineering
Volume2022
DOIs
StatePublished - 2022

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