A Novel Gate Driver with Charge Sharing Technique to Optimize Gate Turn-On/Turn-Off Overshoot and Switching Loss Trade-off in SiC Power MOSFETs

Yu Sheng Hsiao, Wei Chen Yu, Cheng Sung, Wei Cheng Lin, Yi Kai Hsiao, Chia Lung Hung, Zhen Hong Huang, Hao Chung Kuo, Chang Ching Tu, Tian Li Wu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

This paper proposes a charge sharing approach to optimize gate turn-on/turn-off overshoot and switching loss trade-off in SiC Power MOSFETs. The proposed technique achieves significant reductions in overshoot ratios while maintaining similar switching losses compared to conventional methods. Specifically, the proposed technique reduces turn-off overshoot ratio by 57% with only a 30% increase in turn-off switching loss ( E off) and turn-on overshoot ratio by 39% with only a 27% increase in turn-on switching loss ( E on). Moreover, when driving modules with large input capacitance ( C\mathfrak{moduIe), the charge sharing method decreases overshoot ratio by 38% during turn-off and by 23% during turn-on, with minimal impact on switching loss. The results show that using the charge sharing technique can improve the performance of SiC power MOSFETs in power electronics applications.

Original languageEnglish
Title of host publication2024 36th International Symposium on Power Semiconductor Devices and ICs, ISPSD 2024 - Conference Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages184-187
Number of pages4
ISBN (Electronic)9798350394825
DOIs
StatePublished - 2024
Event36th International Symposium on Power Semiconductor Devices and ICs, ISPSD 2024 - Bremen, Germany
Duration: 2 Jun 20246 Jun 2024

Publication series

NameProceedings of the International Symposium on Power Semiconductor Devices and ICs
ISSN (Print)1063-6854

Conference

Conference36th International Symposium on Power Semiconductor Devices and ICs, ISPSD 2024
Country/TerritoryGermany
CityBremen
Period2/06/246/06/24

Keywords

  • Gate driver
  • SiC MOSFETs
  • Switching Loss

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