A Novel Deep Learning Architecture for Global Defect Classification: Self-Proliferating Neural Network (SPNet)

Keyphrases

• Neural Network 100%
• Deep Learning Architectures 100%
• Defect Classification 100%
• Wafer 80%
• Defect Inspection 60%
• Product Yield 20%
• Semiconductor Industry 20%
• Cost Reduction 20%
• Manufacturing Firms 20%
• Defect Pattern 20%
• Classification Task 20%
• Public Dataset 20%
• False Positive Rate 20%
• Learning Representations 20%
• Significant Benefit 20%
• F1 Score 20%
• Additional Review 20%
• Map Pattern 20%
• Product Productivity 20%
• Defect Maps 20%

Engineering

• False Negative 100%
• Defect Classification 100%
• Deep Learning Method 100%
• Product Yield 50%
• Manufacturing Company 50%
• Classification Task 50%