A note on production yield measure for multiple lines

W.l. Pearn; Y. T. Tai; Chia-Huang Wu

doi:10.1080/16843703.2016.1191150

A note on production yield measure for multiple lines

W.l. Pearn, Y. T. Tai^*, Chia-Huang Wu

^*Corresponding author for this work

Department of Industrial Engineering and Management

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

Abstract

In today’s globally competitive environment, processes involving multiple manufacturing lines are quite common due to economies of scale considerations. Production yield measure indices C_pk and C_pu are the most popular yield-based indices and have been widely used in manufacturing industries for two-sided and one-sided specification limits, respectively. In this paper, two production yield indices for multiple lines (Formula presented.) and (Formula presented.) are considered and the approximate distributions of two natural estimators (Formula presented.) and (Formula presented.) are derived. For the convenience of industry applications, the lower confidence bounds and critical values are provided.

Original language	English
Pages (from-to)	394-402
Number of pages	9
Journal	Quality Technology and Quantitative Management
Volume	13
Issue number	4
DOIs	https://doi.org/10.1080/16843703.2016.1191150
State	Published - 1 Oct 2016

Keywords

Capability index
critical value
lower confidence bound
multiple manufacturing lines
production yield

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

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10.1080/16843703.2016.1191150

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title = "A note on production yield measure for multiple lines",

abstract = "In today{\textquoteright}s globally competitive environment, processes involving multiple manufacturing lines are quite common due to economies of scale considerations. Production yield measure indices Cpk and Cpu are the most popular yield-based indices and have been widely used in manufacturing industries for two-sided and one-sided specification limits, respectively. In this paper, two production yield indices for multiple lines (Formula presented.) and (Formula presented.) are considered and the approximate distributions of two natural estimators (Formula presented.) and (Formula presented.) are derived. For the convenience of industry applications, the lower confidence bounds and critical values are provided.",

keywords = "Capability index, critical value, lower confidence bound, multiple manufacturing lines, production yield",

author = "W.l. Pearn and Tai, {Y. T.} and Chia-Huang Wu",

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T1 - A note on production yield measure for multiple lines

AU - Pearn, W.l.

AU - Tai, Y. T.

AU - Wu, Chia-Huang

PY - 2016/10/1

Y1 - 2016/10/1

N2 - In today’s globally competitive environment, processes involving multiple manufacturing lines are quite common due to economies of scale considerations. Production yield measure indices Cpk and Cpu are the most popular yield-based indices and have been widely used in manufacturing industries for two-sided and one-sided specification limits, respectively. In this paper, two production yield indices for multiple lines (Formula presented.) and (Formula presented.) are considered and the approximate distributions of two natural estimators (Formula presented.) and (Formula presented.) are derived. For the convenience of industry applications, the lower confidence bounds and critical values are provided.

AB - In today’s globally competitive environment, processes involving multiple manufacturing lines are quite common due to economies of scale considerations. Production yield measure indices Cpk and Cpu are the most popular yield-based indices and have been widely used in manufacturing industries for two-sided and one-sided specification limits, respectively. In this paper, two production yield indices for multiple lines (Formula presented.) and (Formula presented.) are considered and the approximate distributions of two natural estimators (Formula presented.) and (Formula presented.) are derived. For the convenience of industry applications, the lower confidence bounds and critical values are provided.

KW - Capability index

KW - critical value

KW - lower confidence bound

KW - multiple manufacturing lines

KW - production yield

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SN - 1684-3703

VL - 13

SP - 394

EP - 402

JO - Quality Technology and Quantitative Management

JF - Quality Technology and Quantitative Management

IS - 4

ER -

A note on production yield measure for multiple lines

Abstract

Keywords

UN SDGs

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