A note on "capability assessment for processes with multiple characteristics: A generalization of the popular index Cpk"

W.l. Pearn; Chia-Huang Wu; M. C. Tsai

doi:10.1002/qre.1295

A note on "capability assessment for processes with multiple characteristics: A generalization of the popular index C_pk"

W.l. Pearn, Chia-Huang Wu^*, M. C. Tsai

^*Corresponding author for this work

Department of Industrial Engineering and Management

Research output: Contribution to journal › Article › peer-review

24 Scopus citations

Abstract

The generalized yield index CpkT establishes the relationship between the manufacturing specifications and the actual process performance, which provides a lower bound on process yield for two-sided processes with multiple characteristics. The results attended are very practical for industrial application. In this article, we extended the results in cases with one-sided specification and multiple characteristics. The generalized index CPUT was considered, and the asymptotic distribution of the natural estimator C^PUT was developed. Then, we derived the lower confidence bounds as well as the critical values of index CPUT. We not only provided some tables but also presented an application example.

Original language	English
Pages (from-to)	159-163
Number of pages	5
Journal	Quality and Reliability Engineering International
Volume	29
Issue number	2
DOIs	https://doi.org/10.1002/qre.1295
State	Published - 1 Mar 2013

Keywords

critical values
lower confidence bounds
multiple characteristics
one-sided specification
process capability index

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AB - The generalized yield index CpkT establishes the relationship between the manufacturing specifications and the actual process performance, which provides a lower bound on process yield for two-sided processes with multiple characteristics. The results attended are very practical for industrial application. In this article, we extended the results in cases with one-sided specification and multiple characteristics. The generalized index CPUT was considered, and the asymptotic distribution of the natural estimator C^PUT was developed. Then, we derived the lower confidence bounds as well as the critical values of index CPUT. We not only provided some tables but also presented an application example.

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A note on "capability assessment for processes with multiple characteristics: A generalization of the popular index C_pk"

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Keywords

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