A New Schmitt Trigger Circuit in a 0.13-μm 1/2.5-V CMOS Process to Receive 3.3-V Input Signals

Shih Lun Chen, Ming-Dou Ker

    Research output: Contribution to journalArticlepeer-review

    50 Scopus citations

    Abstract

    A new Schmitt trigger circuit, which is implemented by low-voltage devices to receive the high-voltage input signals without gate-oxide reliability problem, is proposed. The new proposed circuit, which can be operated in a 3.3-V signal environment without suffering high-voltage gate-oxide overstress, has been fabricated in a 0.13-μm 1/2.5-V 1P8M CMOS process. The experimental results have confirmed that the measured transition threshold voltages of the new proposed Schmitt trigger circuit are about 1 and 2.5 V, respectively. The new proposed Schmitt trigger circuit is suitable for mixed-voltage input-output interfaces to receive input signals and reject input noise.

    Original languageEnglish
    Pages (from-to)361-365
    Number of pages5
    JournalIEEE Transactions on Circuits and Systems I: Regular Papers
    Volume52
    Issue number7
    DOIs
    StatePublished - 5 Jul 2005

    Keywords

    • Gate-oxide reliability
    • input-output (I/O)
    • mixed-voltage interface
    • Schmitt trigger

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