Abstract
A new Schmitt trigger circuit, which consists of low-voltage devices, can receive the high-voltage signal without gate-oxide reliability problem, is proposed. The new proposed circuit, which can operate in a 3.3 V signal environment without suffering high-voltage gate-oxide stress, has been fabricated in a 0.13 μm 1/2.5 V CMOS process. The experimental results show that the measured transition threshold voltages of the new proposed Schmitt trigger circuit are about 1 V and 2.5 V, respectively. The proposed Schmitt trigger circuit is suitable for mixed-voltage I/O interfaces circuit to receive the input signals and reject the input noise.
Original language | English |
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Journal | Proceedings - IEEE International Symposium on Circuits and Systems |
Volume | 2 |
DOIs | |
State | Published - 7 Sep 2004 |
Event | 2004 IEEE International Symposium on Cirquits and Systems - Proceedings - Vancouver, BC, Canada Duration: 23 May 2004 → 26 May 2004 |