A new programming scheme for the improvement of program disturb characteristics in scaled nand flash memory

Shirota Riichiro*, Chen Hao Huang, Shinji Nagai, Yoshinori Sakamoto, Fu Hai Li, Nina Mitiukhina, Hideki Arakawa

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

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Engineering & Materials Science

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