A new failure mechanism on analog I/O cell under ND-mode ESD stress in deep-submicron CMOS technology

Shih Hung Chen*, Ming-Dou Ker, Che Hao Chuang

*Corresponding author for this work

    Research output: Contribution to conferencePaperpeer-review

    1 Scopus citations

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    Engineering

    Biochemistry, Genetics and Molecular Biology