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A new failure mechanism on analog I/O cell under ND-mode ESD stress in deep-submicron CMOS technology

  • Shih Hung Chen*
  • , Ming-Dou Ker
  • , Che Hao Chuang
    • *Corresponding author for this work

    Research output: Contribution to conference › Paper › peer-review

    1 Scopus citations

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    Biochemistry, Genetics and Molecular Biology