A multi-contact six-Terminal cross-bridge Kelvin resistor (CBKR) structure for evaluation of interface uniformity of the Ti-Al alloy/p-Type 4H-SiC contact

Yen Ling Chen*, Shih Hao Lai, Jian Hao Lin, Bing Yue Tsui

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

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Material Science

Engineering

Biochemistry, Genetics and Molecular Biology