A Multi-Bit Near-RRAM based Computing Macro with Highly Computing Parallelism for CNN Application

Kuan Chih Lin, Hao Zuo, Hsiang Yu Wang, Yuan Ping Huang, Ci Hao Wu, Yan Cheng Guo, Shyh Jye Jou, Tuo Hung Hou, Tian Sheuan Chang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Resistive random-access memory (RRAM) based compute-in-memory (CIM) is an emerging approach to address the demand for practical implementation of artificial intelligence (AI) on resource constrained edge devices by reducing the power-hungry data transfer between memory and processing unit. However, the state-of-the-art RRAM CIM designs fail to strike a balance between precision, energy efficiency, throughput, and latency. This work merges the techniques of CIM and compute-near-memory (CNM) to deliver high precision, high energy efficiency, high throughput, and low latency. In this paper, a 256Kb RRAM based CNM macro fabricated in TSMC 40 nm process is presented featuring: 1) opposite weight mapping with variation-robust SA to mitigate the impact of RRAM device variations on MAC (Multiply-Accumulate) results; 2) switched-capacitor-based analog multiplication circuit to achieve highly parallel computing of 128 4-bit by 4-bit MAC result with low power consumption and high operation speed; and 3) joint optimization of hardware and software to compensate for the accuracy loss after considering the non-idealities of circuits. The macro achieves a low latency of 17ns and high energy efficiency of 71 TOPS/W for MAC operations with 4-bit input, 4-bit weight and 4-bit output precision. It is used to accelerate the convolution process in the Light-CSPDenseN et AI model, resulting in a high accuracy of 86.33% on Visual Wake Words dataset.

Original languageEnglish
Title of host publication2024 Design, Automation and Test in Europe Conference and Exhibition, DATE 2024 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350348590
StatePublished - 2024
Event2024 Design, Automation and Test in Europe Conference and Exhibition, DATE 2024 - Valencia, Spain
Duration: 25 Mar 202427 Mar 2024

Publication series

NameProceedings -Design, Automation and Test in Europe, DATE
ISSN (Print)1530-1591

Conference

Conference2024 Design, Automation and Test in Europe Conference and Exhibition, DATE 2024
Country/TerritorySpain
CityValencia
Period25/03/2427/03/24

Keywords

  • Artificial intelligence
  • autonomous driving
  • computing-in-memory
  • nonvolatile memory
  • resistive random access memory

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