A Monolithic Low-ILEAK Cross-Coupled GaN Driver with ΔΦ-Reduced EMI-Rejecter for 21.51dBμV-EMI-Reduction and 1/10x filter-capacitor

Hsing Yen Tsai, Shi Jun Zeng, Yu Teng Liang, Ke Horng Chen, Kuo Lin Zheng, Chih Chen Li

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The proposed ΔΦ-reduced EMI rejecter reduces the EMI amplitude of 21.51dBμV, passes CISPR25 specification, and reduces the filter capacitor by 1/10 times, thereby reducing the PCB size. The proposed monolithic low ILEAK cross-coupled GaN driver provides a dv/dt of 111.2V/ns for V sw and maintains V GH at VBT for more than 1000μs at 150°C in long-term chamber tests. The peak efficiency is 94.5%. In a 400V-to-48V conversion, the output power is 240W (=48V∗5A) and meets the USB PD 3.1 standard.

Original languageEnglish
Title of host publication2024 IEEE Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2024
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350361469
DOIs
StatePublished - 2024
Event2024 IEEE Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2024 - Honolulu, United States
Duration: 16 Jun 202420 Jun 2024

Publication series

NameDigest of Technical Papers - Symposium on VLSI Technology
ISSN (Print)0743-1562

Conference

Conference2024 IEEE Symposium on VLSI Technology and Circuits, VLSI Technology and Circuits 2024
Country/TerritoryUnited States
CityHonolulu
Period16/06/2420/06/24

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