A method for determining the specific capacitance value of mesoscopic Josephson junctions

Sheng Shiuan Yeh; Kuan Wen Chen; Tao Hsiang Chung; Dai Yang Wu; Ming Chou Lin; Jyh Yang Wang; I. Lin Ho; Cen Shawn Wu; Watson Kuo; Chiidong Chen

doi:10.1063/1.4769999

A method for determining the specific capacitance value of mesoscopic Josephson junctions

Sheng Shiuan Yeh, Kuan Wen Chen, Tao Hsiang Chung, Dai Yang Wu, Ming Chou Lin, Jyh Yang Wang, I. Lin Ho, Cen Shawn Wu, Watson Kuo, Chiidong Chen^*

^*Corresponding author for this work

International College of Semiconductor Technology

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

An approach for precise determination of capacitance values and energy level spacing of mesoscopic Josephson junctions is proposed. Quantized levels arising from plasma oscillation manifest themselves in the current peaks in the current-voltage characteristics of a nearby probe Josephson junction. From peak spacing, the specific capacitance of aluminum junctions is determined to be 35 fF/μm². In addition, magnetic field dependence of quantum states can be described quantitatively by a theory that takes the effect of field induced surface current into account.

Original language	English
Article number	232602
Journal	Applied Physics Letters
Volume	101
Issue number	23
DOIs	https://doi.org/10.1063/1.4769999
State	Published - 3 Dec 2012

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abstract = "An approach for precise determination of capacitance values and energy level spacing of mesoscopic Josephson junctions is proposed. Quantized levels arising from plasma oscillation manifest themselves in the current peaks in the current-voltage characteristics of a nearby probe Josephson junction. From peak spacing, the specific capacitance of aluminum junctions is determined to be 35 fF/μm2. In addition, magnetic field dependence of quantum states can be described quantitatively by a theory that takes the effect of field induced surface current into account.",

author = "Yeh, {Sheng Shiuan} and Chen, {Kuan Wen} and Chung, {Tao Hsiang} and Wu, {Dai Yang} and Lin, {Ming Chou} and Wang, {Jyh Yang} and Ho, {I. Lin} and Wu, {Cen Shawn} and Watson Kuo and Chiidong Chen",

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AU - Yeh, Sheng Shiuan

AU - Chen, Kuan Wen

AU - Chung, Tao Hsiang

AU - Wu, Dai Yang

AU - Lin, Ming Chou

AU - Wang, Jyh Yang

AU - Ho, I. Lin

AU - Wu, Cen Shawn

AU - Kuo, Watson

AU - Chen, Chiidong

PY - 2012/12/3

Y1 - 2012/12/3

N2 - An approach for precise determination of capacitance values and energy level spacing of mesoscopic Josephson junctions is proposed. Quantized levels arising from plasma oscillation manifest themselves in the current peaks in the current-voltage characteristics of a nearby probe Josephson junction. From peak spacing, the specific capacitance of aluminum junctions is determined to be 35 fF/μm2. In addition, magnetic field dependence of quantum states can be described quantitatively by a theory that takes the effect of field induced surface current into account.

AB - An approach for precise determination of capacitance values and energy level spacing of mesoscopic Josephson junctions is proposed. Quantized levels arising from plasma oscillation manifest themselves in the current peaks in the current-voltage characteristics of a nearby probe Josephson junction. From peak spacing, the specific capacitance of aluminum junctions is determined to be 35 fF/μm2. In addition, magnetic field dependence of quantum states can be described quantitatively by a theory that takes the effect of field induced surface current into account.

UR - http://www.scopus.com/inward/record.url?scp=84870871758&partnerID=8YFLogxK

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SN - 0003-6951

VL - 101

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 23

M1 - 232602

ER -

A method for determining the specific capacitance value of mesoscopic Josephson junctions

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