A GaN-on-Si Gate Driver with 14.7X Reduction in Tailing Current Loss and 37.0% Reduction of Reverse Conduction Loss

Hsing Yen Tsai*, Kuo Lin Zheng, Ke Horng Chen, Ying Hsi Lin, Shian Ru Lin, Tsung Yen Tsai

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

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Engineering & Materials Science