TY - GEN
T1 - A fully-parallel step-by-step BCH decoder over composite field for NOR flash memories
AU - Chen, Yi Hsun
AU - Yang, Chi Heng
AU - Chang, Hsie-Chia
PY - 2012
Y1 - 2012
N2 - This paper presents a (274,256,2) DEC BCH decoder for NOR flash memories to improve the reliability. From the step-by-step algorithm, the decoding mechanism can be derived from a simple checking equation and its fully-parallel architecture is implemented to meet the low latency requirement. Moreover, the composite field arithmetic without extra field conversion hardware is applied to the whole decoder for further reducing complexity. By using UMC 90 nm CMOS technology, the synthesis results show that the latency is 2.5 ns with 23.2K logic gates.
AB - This paper presents a (274,256,2) DEC BCH decoder for NOR flash memories to improve the reliability. From the step-by-step algorithm, the decoding mechanism can be derived from a simple checking equation and its fully-parallel architecture is implemented to meet the low latency requirement. Moreover, the composite field arithmetic without extra field conversion hardware is applied to the whole decoder for further reducing complexity. By using UMC 90 nm CMOS technology, the synthesis results show that the latency is 2.5 ns with 23.2K logic gates.
KW - BCH codes
KW - Composite field
KW - Double-Error-Correcting
KW - NOR flash memories
KW - Step-by-step decoding algorithm
UR - http://www.scopus.com/inward/record.url?scp=84864045440&partnerID=8YFLogxK
U2 - 10.1109/VLSI-DAT.2012.6212602
DO - 10.1109/VLSI-DAT.2012.6212602
M3 - Conference contribution
AN - SCOPUS:84864045440
SN - 9781457720819
T3 - 2012 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2012 - Proceedings of Technical Papers
BT - 2012 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2012 - Proceedings of Technical Papers
T2 - 2012 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2012
Y2 - 23 April 2012 through 25 April 2012
ER -