Fingerprint
Dive into the research topics of 'A comprehensive study of hot carrier stress-induced drain leakage current degradation in thin-oxide n-MOSFET's'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
A comprehensive study of hot carrier stress-induced drain leakage current degradation in thin-oxide n-MOSFET's
Ta-Hui Wang*, Lu Ping Chiang, Nian Kai Zous, Charng Feng Hsu, Li Yuan Huang, Tien-Sheng Chao
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
41
Scopus
citations