A CMOS Synchronized Sample-and-Hold Artifact Blanking Analog Front-End Local Field Potential Acquisition Unit with ±3.6-V Stimulation Artifact Tolerance and Monopolar Electrode-Tissue Impedance Measurement Circuit for Closed-Loop Deep Brain Stimulation SoCs

Chi Wei Huang, Chin Kai Lai, Chung Chih Hung, Chung-Yu Wu^*, Ming Dou Ker^*

^*Corresponding author for this work

Department of Electrical and Computer Engineering
Center for Neuromodulation Medical Electronics Systems
Institute of Electronics

Research output: Contribution to journal › Article › peer-review

12 Scopus citations

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A CMOS Synchronized Sample-and-Hold Artifact Blanking Analog Front-End Local Field Potential Acquisition Unit with ±3.6-V Stimulation Artifact Tolerance and Monopolar Electrode-Tissue Impedance Measurement Circuit for Closed-Loop Deep Brain Stimulation SoCs

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