Abstract
A 60-nm-thick E-mode In0.65Ga0.35As/InAs/In0.65Ga0.35As high-electron-mobility transistor (HEMT) was successfully fabricated and evaluated by using Au/Pt/Ti-based non-annealed ohmic technology for high-speed and low-power logic applications. The device exhibited a minimal SS of 69mV/decade, a lower DIBL of 30mV/V, an ION/IOFF ratio above 1.2 × 104 at VDS = 0.5V and a high fT of 378GHz and fmax of 214GHz at VDS = 1.0V. These results demonstrate that non-annealed ohmic contacts can be used for fabricating E-mode In0.65Ga0.35As/InAs/In0.65Ga0.35As HEMTs with excellent electrical characteristics. The fabricated HEMTs are likely to find use in future high-speed and low-power logic applications.
| Original language | English |
|---|---|
| Article number | 026502 |
| Journal | Applied Physics Express |
| Volume | 9 |
| Issue number | 2 |
| DOIs | |
| State | Published - Feb 2016 |
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