TY - GEN
T1 - A 2 × 20-Gb/s, 1.2-pJ/bit, time-interleaved optical receiver in 40-nm CMOS
AU - Huang, Shih Hao
AU - Hung, Zheng Hao
AU - Chen, Wei Zen
N1 - Publisher Copyright:
© 2014 IEEE.
PY - 2015/1/13
Y1 - 2015/1/13
N2 - This paper describes a single-chip, 2 × 20-Gb/s time-interleaved integrating-type optical receiver. Combining with correlation-based timing recovery and 1:4 demultiplexer, it achieves a high energy efficiency of 1.2-pJ/bit. By incorporating the proposed alternating photodetector (ALPD) current-sensing scheme, the front-end receiver is 4-way time-interleaved to increase input sensitivity and relax operating speed of digital comparator. The optical receiver achieves an input sensitivity of 44 μApp at bit-error-rate of less than 10-12. Fabricated in a 40-nm bulk CMOS technology, the chip size is 0.46 mm2.
AB - This paper describes a single-chip, 2 × 20-Gb/s time-interleaved integrating-type optical receiver. Combining with correlation-based timing recovery and 1:4 demultiplexer, it achieves a high energy efficiency of 1.2-pJ/bit. By incorporating the proposed alternating photodetector (ALPD) current-sensing scheme, the front-end receiver is 4-way time-interleaved to increase input sensitivity and relax operating speed of digital comparator. The optical receiver achieves an input sensitivity of 44 μApp at bit-error-rate of less than 10-12. Fabricated in a 40-nm bulk CMOS technology, the chip size is 0.46 mm2.
KW - Monolithic optical receiver
KW - comparator
KW - high-density optical interconnect
KW - photodetector (PD)
UR - http://www.scopus.com/inward/record.url?scp=84922574275&partnerID=8YFLogxK
U2 - 10.1109/ASSCC.2014.7008869
DO - 10.1109/ASSCC.2014.7008869
M3 - Conference contribution
AN - SCOPUS:84922574275
T3 - 2014 IEEE Asian Solid-State Circuits Conference, A-SSCC - Proceedings of Technical Papers
SP - 97
EP - 100
BT - 2014 IEEE Asian Solid-State Circuits Conference, A-SSCC - Proceedings of Technical Papers
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2014 10th IEEE Asian Solid-State Circuits Conference, A-SSCC 2014
Y2 - 10 November 2014 through 12 November 2014
ER -