62.3% Reduction of Power Dissipation and 60% Reduction of Recovery Time Caching Digital Low Dropout Regulator

Chia Ming Huang, Cheng Yen Lee, Jian He Lin, Ke Horng Chen, Ying Hsi Lin, Jian Ru Lin, Tsung Yen Tsai

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Different from conventional digital low dropout (DLDO)regulators that adaptively respond to load changes,the proposed DLDO regulator communicates with the microprocessor to achieve fast transient response at low switching frequencies. The proposed data detection (DD) technique collects data and sends it to the cache to record the operation of the entire circuit at different drive currents. Error Quantization Control (EQC) sets adequate compensation to immediately regulate the output voltage. Therefore,compensation corresponding to different load currents can eliminate unnecessary recovery time,and limit the number of switchable power MOSFETs to one to reduce the limit cycle oscillation (LCO). The test chip fabricated in CMOS 40nm process proves the settling time reduces from 1.3μs to 0.52μs. At the same time,more than 62.3% reduction in power and 60% reduction in recovery time can be achieved.

Original languageEnglish
Title of host publication2021 IEEE International Future Energy Electronics Conference, IFEEC 2021
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781665434485
DOIs
StatePublished - 2021
Event2021 IEEE International Future Energy Electronics Conference, IFEEC 2021 - Taipei, Taiwan
Duration: 16 Nov 202119 Nov 2021

Publication series

Name2021 IEEE International Future Energy Electronics Conference, IFEEC 2021

Conference

Conference2021 IEEE International Future Energy Electronics Conference, IFEEC 2021
Country/TerritoryTaiwan
CityTaipei
Period16/11/2119/11/21

Fingerprint

Dive into the research topics of '62.3% Reduction of Power Dissipation and 60% Reduction of Recovery Time Caching Digital Low Dropout Regulator'. Together they form a unique fingerprint.

Cite this