3D device simulation of work function and interface trap fluctuations on high-κ / metal gate devices

Hui Wen Cheng*, Fu Hai Li, Ming Hung Han, Chun Yen Yiu, Chia Hui Yu, Kuo Fu Lee, Yiming Li

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

31 Scopus citations

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