27.8 Dynamic-Charging Current-Scaling Technique with Dual Accurate Current Control and Temperature Loops with Charging-Current Accuracy up to 99.6% for 1.6× Faster Lithium-Ion Battery Charging

Wei-Tin Lin*, Zong-Yi Lin, Chia-Hao Liu, Chia-Ming Huang, Li-Cheng Chu, Ke-Horng Chen, Yin-Hsi Lin, Shian-Ru Lin, Tsung-Yen Tsai, Hann-Huei Tsai, Ying-Zong Juang

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Abstract

Reliability is one of the most important issues for lithium-ion (Li-Ion) battery fast charging. Due to the limited charge-acceptance rate of a Li-Ion battery, a fast charging technology needs to consider the main problems that can result in LiIon battery damage [1]. Pumping large amounts of energy into a Li-Ion battery, faster than the battery chemicals can react to the charge, can result in local polarization of the electrode, overheating, and unpredictable chemical reactions that can damage the Li-Ion battery. Conventional battery chargers use over-temperature and under-temperature protection [2], while some advanced battery chargers contain a temperature-controlled current to limit the charging current for safe charging [3]. In the event of overheating, a fast charging mechanism should stop until the temperature drops to a safe level. Fast charging on/off control is not the single unique factor that determines charging time [4]. Similar to dynamic voltage and frequency scaling (DVFS) technology in power management ICs (PMICs), this paper proposes a dynamic charge current scaling (DCCS) technique, which dynamically adjusts the charging current and the termination charging voltage in constant-current (CC) charge mode depending on the battery temperature ( T-{{BAT}})and the built-in resistance detection (BIRD) technique.

Original languageEnglish
Title of host publication2019 IEEE INTERNATIONAL SOLID-STATE CIRCUITS CONFERENCE (ISSCC)
EditorsLC Fujino, JH Anderson, L Belostotski, D Dunwell, Gaudet, G Gulak, JW Haslett, D Halupka, KC Smith
PublisherIEEE
Pages434-436
Number of pages3
ISBN (Electronic)9781538685310
DOIs
StatePublished - 17 Feb 2019
Event2019 IEEE International Solid-State Circuits Conference, ISSCC 2019 - San Francisco, United States
Duration: 17 Feb 201921 Feb 2019

Publication series

NameIEEE International Solid State Circuits Conference
PublisherIEEE
Volume62
ISSN (Print)0193-6530

Conference

Conference2019 IEEE International Solid-State Circuits Conference, ISSCC 2019
Country/TerritoryUnited States
CitySan Francisco
Period17/02/1921/02/19

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