0.65V-input-voltage 0.6V-output-voltage 30ppm/°C low-dropout regulator with embedded voltage reference for low-power biomedical systems

Wei Chung Chen, Yi Ping Su, Yu Huei Lee, Chin-Long Wey, Ke-Horng Chen

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

18 Scopus citations

Abstract

Supplying a regulated 0.6V to biomedical systems requires a low dropout (LDO) regulator with a maximum driving current capability of 10mA. One sub-1V voltage reference circuit is commonly used in the conventional LDO design to generate the reference voltage VREF with a low temperature coefficient (TC), as shown in Fig. 17.10.1. VREF is sent to the inverting terminal of the error amplifier (EA) to regulate the output voltage VOUT. The critical path of the voltage headroom exists between V REF and VIN through the inverting terminal and the tail current of the EA. That is, VIN>VSG+V OV+VREF ≈|Vtp|+2VOV+V REF, where VIN is the input supply voltage, Vtp is the threshold voltage of the p-type MOSFET and VOV is the overdrive voltage. If the minimum value of VIN is reduced to 0.65V, the derived VREF should be smaller than 50mV when |Vtp| is 0.4V and |VOV| is 0.1V. Such a sub-1V voltage reference circuit is difficult to design [1]-[4]. Even if VREF can be derived, the offset voltage in the EA will seriously affect the exact value of VREF (≤50mV). In addition, the low noise immunity is another disadvantage that severely affects the performance of the biomedical system.

Original languageEnglish
Title of host publication2014 IEEE International Solid-State Circuits Conference, ISSCC 2014 - Digest of Technical Papers
PublisherIEEE
Pages304-305
Number of pages2
Volume57
ISBN (Print)9781479909186
DOIs
StatePublished - 1 Jan 2014
Event2014 61st IEEE International Solid-State Circuits Conference, ISSCC 2014 - San Francisco, CA, United States
Duration: 9 Feb 201413 Feb 2014

Publication series

NameDigest of Technical Papers - IEEE International Solid-State Circuits Conference
Volume57
ISSN (Print)0193-6530

Conference

Conference2014 61st IEEE International Solid-State Circuits Conference, ISSCC 2014
Country/TerritoryUnited States
CitySan Francisco, CA
Period9/02/1413/02/14

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