Chih Chen (Inventor)
Research output: Patent
}
TY - PAT
T1 - 一種結合凱文與花環複合結構用於精密觀測銲錫凸塊接點之電阻變化
AU - Chen, Chih
PY - 2015/6/17
Y1 - 2015/6/17
M3 - Patent
M1 - 1697852
ER -