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π-SCR Device for Broadband ESD Protection in Low-Voltage CMOS Technology
Chun Yu Lin
*
, Yu Hsuan Lai
*
Corresponding author for this work
Institute of Electronics
Research output
:
Contribution to journal
›
Article
›
peer-review
11
Scopus citations
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Keyphrases
CMOS Technology
100%
Electrostatic Discharge (ESD) Protection
100%
Low Power CMOS
100%
Silicon-controlled Rectifier
100%
Diode
50%
High-frequency Performance
33%
Electrostatic Discharge Test
33%
Clamping Voltage
33%
Insertion Loss
16%
Integrated Circuits
16%
Inductors
16%
Protection Design
16%
Electrostatic Discharge
16%
Latch-up
16%
Negative Impact
16%
Protection Device
16%
Broadband Performance
16%
Engineering
Electrostatic Discharge
100%
Silicon-Controlled Rectifier
100%
Protection Device
14%
Negative Impact
14%
Good Choice
14%
Insertion Loss
14%
Integrated Circuit
14%
Material Science
Silicon
100%
Electronic Circuit
14%