Project Details
| Status | Finished |
|---|---|
| Effective start/end date | 1/08/13 → 31/07/14 |
Process Variation Effect and Intrinstic Parameter Fluctuation in Sub-16-nm-Gate Multi-Channel Bulk FinFETs and Gate-All-Around FETs
- 李, 義明 (PI)
| Status | Finished |
|---|---|
| Effective start/end date | 1/08/13 → 31/07/14 |