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Next-generation Reliable GaN Electronics: CMOS Compatible Beyond 1000V GaN-on-Si Devices, Exploration of the GaN Power Devices for Space Applications, and Machine Learning to Accelerate the Optimization of the Characteristics and Reliability
Wu, Tian-Li
(PI)
International College of Semiconductor Technology
Overview
Project Details
Status
Finished
Effective start/end date
1/02/19
→
31/01/20
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