Project Details
| Status | Finished |
|---|---|
| Effective start/end date | 1/08/21 → 31/07/22 |
Characteristic Fluctuation of Gate-All-Around MOSFETs and Negative Capacitance FETs and Their Modeling via Deep-Learning Methodology
- Li, Yi-Ming (PI)
| Status | Finished |
|---|---|
| Effective start/end date | 1/08/21 → 31/07/22 |