Calculated based on number of publications stored in Pure and citations from Scopus
Calculated based on number of publications stored in Pure and citations from Scopus
Calculated based on number of publications stored in Pure and citations from Scopus
19992024

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  • 2010

    16-nm multigate and multifin MOSFET device and SRAM circuits

    Cheng, H. W. & Li, Y., 2010, 2010 International Symposium on Next-Generation Electronics, ISNE 2010 - Conference Program. p. 32-35 4 p. 5669144. (2010 International Symposium on Next-Generation Electronics, ISNE 2010 - Conference Program).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    13 Scopus citations
  • 3D device simulation of work function and interface trap fluctuations on high-κ / metal gate devices

    Cheng, H. W., Li, F. H., Han, M. H., Yiu, C. Y., Yu, C. H., Lee, K. F. & Li, Y., 2010, 2010 IEEE International Electron Devices Meeting, IEDM 2010. p. 15.6.1-15.6.4 5703370. (Technical Digest - International Electron Devices Meeting, IEDM).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    40 Scopus citations
  • A comparative study of dynamic characteristics on 16-nm-gate planar CMOS and bulk FinFETs' differential amplifier

    Cheng, H. W. & Li, Y., 2010, 2010 International Conference on Enabling Science and Nanotechnology, ESciNano 2010 - Proceedings. 5701053. (2010 International Conference on Enabling Science and Nanotechnology, ESciNano 2010 - Proceedings).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Amorphous silicon thin-film transistor gate driver circuit design optimization using a simulation-based evolutionary technique

    Chiu, Y. J., Lee, K. F., Chen, Y. C., Cheng, H. W., Li, Y., Chiang, T., Huang, K. Y. & Hsieh, T. H., 2010, ICSE 2010 - Proceedings IEEE International Conference on Semiconductor Electronics. p. 123-126 4 p. 5549386. (IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Characteristic optimization of single- and double-gate tunneling field effect transistors

    Lee, K. F., Li, Y., Yiu, C. Y., Su, Z. C., Lo, I. S., Cheng, H. W., Han, M. H. & Khaing, T. T., Jan 2010, Nanotechnology 2010: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational - Technical Proceedings of the 2010 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2010. p. 65-68 4 p. (Nanotechnology 2010: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational - Technical Proceedings of the 2010 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2010; vol. 2).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    4 Scopus citations
  • Comprehensive examination of intrinsic-parameter-induced characteristic fluctuations in 16-nm-gate CMOS devices

    Han, M. H., Li, Y., Lee, K. F., Cheng, H. W. & Su, Z. C., Jun 2010, Nanotechnology 2010: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational - Technical Proceedings of the 2010 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2010. p. 21-24 4 p. (Nanotechnology 2010: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational - Technical Proceedings of the 2010 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2010; vol. 2).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Effect of intrinsic-parameter fluctuations on 16-nm-gate CMOS and current mirror circuit

    Yiu, C. Y., Li, Y., Han, M. H., Lee, K. F., Khaing, T. T., Cheng, H. W. & Su, Z. C., 2010, 2010 10th IEEE Conference on Nanotechnology, NANO 2010. p. 798-801 4 p. 5697825. (2010 10th IEEE Conference on Nanotechnology, NANO 2010).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    4 Scopus citations
  • Effects of shape and size on field enhancement of Au nanoparticles on SERS-active substrates

    Cheng, H. W., Li, Y. & Yang, J. Y., 2010, 2010 10th IEEE Conference on Nanotechnology, NANO 2010. p. 732-735 4 p. 5697814. (2010 10th IEEE Conference on Nanotechnology, NANO 2010).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    2 Scopus citations
  • Electrical characteristic fluctuation and suppression in emerging CMOS device and circuit

    Cheng, H. W., Han, M. H., Li, Y., Lee, K. F., Yiu, C. Y. & Khaing, T. T., 2010, 2010 Silicon Nanoelectronics Workshop, SNW 2010. 5562560. (2010 Silicon Nanoelectronics Workshop, SNW 2010).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Electrical characteristics of 16-nm multi-gate-and-multi-fin field effect transistors and digital circuits

    Cheng, H. W. & Li, Y., Jun 2010, Nanotechnology 2010: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational - Technical Proceedings of the 2010 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2010. p. 721-724 4 p. (Nanotechnology 2010: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational - Technical Proceedings of the 2010 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2010; vol. 2).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    1 Scopus citations
  • Electrical characteristic variability in 16-nm multi-gate MOSFET current mirror circuit

    Cheng, H. W. & Li, Y., 2010, 2010 International Conference on Enabling Science and Nanotechnology, ESciNano 2010 - Proceedings. 5701052. (2010 International Conference on Enabling Science and Nanotechnology, ESciNano 2010 - Proceedings).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Experimental and theoretical examination of field enhancement in Au nanoparticles of SERS-active substrate for detecting rhodamine 6G

    Cheng, H. W., Yang, J. Y. & Li, Y., 2010, 2010 International Conference on Enabling Science and Nanotechnology, ESciNano 2010 - Proceedings. 5701051. (2010 International Conference on Enabling Science and Nanotechnology, ESciNano 2010 - Proceedings).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Gate driver circuit design optimization for TFT-LCD panel manufacturing

    Lee, K. F., Li, Y., Lo, I. H., Chiang, T., Huang, K. Y. & Hsieh, T. H., 2010, Proceedings of the 2nd Asia Symposium on Quality Electronic Design, ASQED 2010. p. 13-16 4 p. 5548165. (Proceedings of the 2nd Asia Symposium on Quality Electronic Design, ASQED 2010).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    2 Scopus citations
  • Highly optimized electrical characteristics of a-Si TFT gate driver for display panel manufacturing

    Lo, I. H., Li, Y., Lee, K. F., Chiang, T., Huang, K. Y. & Hsieh, T. H., Oct 2010, 10th International Meeting on Information Display and International Display Manufacturing Conference and Asia Display 2010, IMID/IDMC/ASIA Display 2010. p. 114-115 2 p. (Proceedings of International Meeting on Information Display).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    4 Scopus citations
  • Hybrid genetic algorithm with mixed mutation mechanism for optimal display panel circuit design

    Lo, I. H., Li, Y. & Lee, K. F., 2010, Proceedings - International Conference on Technologies and Applications of Artificial Intelligence, TAAI 2010. p. 222-225 4 p. 5695457. (Proceedings - International Conference on Technologies and Applications of Artificial Intelligence, TAAI 2010).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    2 Scopus citations
  • Hydrothermal growth of ZnO nanostructures using zinc thin films as seed layer

    Yang, J. Y., Cheng, H. W., Cheng, T. C. & Li, Y., Jun 2010, Nanotechnology 2010: Advanced Materials, CNTs, Particles, Films and Composites - Technical Proceedings of the 2010 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2010. p. 460-463 4 p. (Nanotechnology 2010: Advanced Materials, CNTs, Particles, Films and Composites - Technical Proceedings of the 2010 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2010; vol. 1).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    1 Scopus citations
  • Intrinsic parameter fluctuations on current mirror circuit with different aspect ratio of 16-nm Multi-Gate MOSFET

    Cheng, H. W., Yiu, C. Y., Khaing, T. T. & Li, Y., 2010, 2010 Silicon Nanoelectronics Workshop, SNW 2010. 5562570. (2010 Silicon Nanoelectronics Workshop, SNW 2010).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    1 Scopus citations
  • Metal-gate work-function fluctuation in 16-nm single- and multi-fin field effect transistors with different aspect ratio

    Cheng, H. W. & Li, Y., 2010, ICSE 2010 - Proceedings IEEE International Conference on Semiconductor Electronics. p. 48-51 4 p. 5549472. (IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    3 Scopus citations
  • Modeling of work-function fluctuation for 16 nm FinFET devices with TiN/HfSiON gate stack

    Hwang, C. H. & Li, Y., 2010, Proceedings of 2010 International Symposium on VLSI Technology, System and Application, VLSI-TSA 2010. p. 74-75 2 p. 5488942. (Proceedings of 2010 International Symposium on VLSI Technology, System and Application, VLSI-TSA 2010).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    2 Scopus citations
  • Nanostructure evolution of titanium dioxide layers from titanium thin films using hydrothermal treatment

    Yang, J. Y., Cheng, H. W. & Li, Y., 2010, 2010 International Conference on Enabling Science and Nanotechnology, ESciNano 2010 - Proceedings. 5701050. (2010 International Conference on Enabling Science and Nanotechnology, ESciNano 2010 - Proceedings).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Random-dopant-induced DC characteristic fluctuations in 16-nm-gate LAC and inLAC MOSFET devices

    Khaing, T. T., Cheng, H. W., Lee, K. F. & Li, Y., 2010, ICSE 2010 - Proceedings IEEE International Conference on Semiconductor Electronics. p. 237-240 4 p. 5549571. (IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Random work function variation induced threshold voltage fluctuation in 16-nm bulk FinFET devices with high-κ-metal-gate material

    Cheng, H. W. & Li, Y., 2010, 2010 14th International Workshop on Computational Electronics, IWCE 2010. p. 331-334 4 p. 5677948. (2010 14th International Workshop on Computational Electronics, IWCE 2010).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    16 Scopus citations
  • Shape effect on the reflectance of sub-wavelength structures on silicon nitride for solar cell application

    Sahoo, K. C., Li, Y. & Chang, E. Y., Jun 2010, Nanotechnology 2010: Bio Sensors, Instruments, Medical, Environment and Energy - Technical Proceedings of the 2010 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2010. p. 737-740 4 p. (Nanotechnology 2010: Bio Sensors, Instruments, Medical, Environment and Energy - Technical Proceedings of the 2010 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2010; vol. 3).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Simulation of Raman enhancement in SERS-Active substrates with Au layer considering different geometry of nanoparticles

    Cheng, H. W. & Li, Y., 2010, 2010 14th International Workshop on Computational Electronics, IWCE 2010. p. 263-266 4 p. 5677966. (2010 14th International Workshop on Computational Electronics, IWCE 2010).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    3 Scopus citations
  • Statistical simulation of metal-gate work-function fluctuation in high-κ/metal-gate devices

    Yu, C. H., Han, M. H., Cheng, H. W., Su, Z. C., Li, Y.-M. & Watanabe, H., 6 Dec 2010, 15th International Conference on Simulation of Semiconductor Processes and Devices, SISPAD 2010. Baccarani, G. & Rudan, M. (eds.). IEEE, p. 153-156 4 p. 5604544. (International Conference on Simulation of Semiconductor Processes and Devices).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    12 Scopus citations
  • Suppression of random-dopant-induced characteristic fluctuation in 16 nm MOSFET devices using dual-material gate

    Yiu, C. Y., Ciou, Y. Y., Chang, R. W., Lee, K. F., Cheng, H. W. & Li, Y., 2010, 2010 International Symposium on Next-Generation Electronics, ISNE 2010 - Conference Program. p. 28-31 4 p. 5669139. (2010 International Symposium on Next-Generation Electronics, ISNE 2010 - Conference Program).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • 2009

    3D 65nm CMOS with 320°C microwave dopant activation

    Lee, Y. J., Lu, Y. L., Hsueh, F. K., Huang, K. C., Wan, C. C., Cheng, T. Y., Han, M. H., Kowalski, J. M., Kowalski, J. E., Heh, D., Chuang, H. T., Li, Y.-M., Chao, T.-S., Wu, C. Y. & Yang, F. L., 2009, 2009 International Electron Devices Meeting, IEDM 2009 - Technical Digest. p. 2.3.1-2.3.4 54244263. (Technical Digest - International Electron Devices Meeting, IEDM).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    17 Scopus citations
  • A dynamic competition simulation for worldwide big-size TV market using lotka-volterra model

    Chen, W. T. T., Li, Y.-M. & Hung, C.-Y., 2009, Computational Methods in Science and Engineering - Advances in Computational Science, Lectures Presented at the Int. Conference on Computational Methods in Science and Engineering 2008, ICCMSE 2008. p. 509-513 5 p. (AIP Conference Proceedings; vol. 1148 2).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • A unified parameterization technique for TFT-LCD panel design optimization

    Huang, H. M. & Li, Y.-M., 2009, 2009 1st Asia Symposium on Quality Electronic Design, ASQED 2009. p. 153-156 4 p. 5206278. (2009 1st Asia Symposium on Quality Electronic Design, ASQED 2009).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    4 Scopus citations
  • Characteristics variability of novel lateral asymmetry nano-MOSFETs due to random discrete dopant

    Lee, K. F., Hwang, C. H., Li, T. Y. & Li, Y.-M., 3 May 2009, Nanotechnology 2009: Fabrication, Particles, Characterization, MEMS, Electronics and Photonics - Technical Proceedings of the 2009 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2009. p. 602-605 4 p. (Nanotechnology 2009: Fabrication, Particles, Characterization, MEMS, Electronics and Photonics - Technical Proceedings of the 2009 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2009; vol. 1).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Design and fabrication of sub-wavelength structure on silicon nitride for solar cells

    Sahoo, K. C., Li, Y.-M., Lin, M. K., Chang, E. Y. & Huang, J. H., 26 Jul 2009, 2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009. IEEE, p. 109-112 4 p. 5394589. (2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    2 Scopus citations
  • Detection of Staphylococcus aureus using hydrothermally roughened substrates

    Yang, J. Y., Chen, Y., Cheng, H. W., Lin, C.-H. & Li, Y.-M., 2009, 2009 IEEE 3rd International Conference on Nano/Molecular Medicine and Engineering, NANOMED 2009. IEEE, p. 210-214 5 p. 5559085. (2009 IEEE 3rd International Conference on Nano/Molecular Medicine and Engineering, NANOMED 2009).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    2 Scopus citations
  • Effect of process variation on 15-nm-gate stacked multichannel surrounding-gate field effect transistor

    Han, M. H., Cheng, H. W., Hwang, C. H. & Li, Y.-M., 26 Jul 2009, 2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009. IEEE, p. 222-225 4 p. 5394591. (2009 9th IEEE Conference on Nanotechnology, IEEE NANO 2009).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Electrical characteristics of nanoscale multi-fin field effect transistors with different fin aspect ratio

    Cheng, H. W., Hwang, C. H. & Li, Y.-M., 3 May 2009, Nanotechnology 2009: Fabrication, Particles, Characterization, MEMS, Electronics and Photonics - Technical Proceedings of the 2009 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2009. p. 609-612 4 p. (Nanotechnology 2009: Fabrication, Particles, Characterization, MEMS, Electronics and Photonics - Technical Proceedings of the 2009 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2009; vol. 1).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Equivalent circuit extraction for passive devices

    Kuo, Y. T., Chao, H. Y. & Li, Y.-M., 25 Mar 2009, Proceedings of the European Computing Conference. VOL.1 ed. Springer, p. 123-131 9 p. (Lecture Notes in Electrical Engineering; vol. 27 LNEE, no. VOL.1).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Modeling of price effects for the adoption of LCD TV

    Tsai, B. H., Li, Y. & Lee, G. H., 27 Nov 2009, PICMET 2009 - 2009 Portland International Conference on Management of Engineering and Technology - Proceedings. p. 2631-2637 7 p. 5261817. (PICMET: Portland International Center for Management of Engineering and Technology, Proceedings).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    1 Scopus citations
  • Optimal doping profile of MOSFETs using geometric programming

    Chen, Y. C. & Li, Y., 2009, Computational Methods in Science and Engineering - Advances in Computational Science, Lectures Presented at the Int. Conference on Computational Methods in Science and Engineering 2008, ICCMSE 2008. p. 458-461 4 p. (AIP Conference Proceedings; vol. 1148 2).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Parameterized display performances behavioral modeling and optimization for TFT-LCD panel

    Huang, H. M. & Li, Y.-M., 2009, Technical Proceedings of the 2009 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2009. p. 379-382 4 p. (Technical Proceedings of the 2009 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2009; vol. 3).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Process- and random-dopant-induced characteristic variability of SRAM with nano-CMOS and bulk FinFET devices

    Li, T. Y., Hwang, C. H. & Li, Y.-M., 3 May 2009, Nanotechnology 2009: Fabrication, Particles, Characterization, MEMS, Electronics and Photonics - Technical Proceedings of the 2009 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2009. Vol. 1. p. 586-589 4 p. (Nanotechnology 2009: Fabrication, Particles, Characterization, MEMS, Electronics and Photonics - Technical Proceedings of the 2009 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2009; vol. 1).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Process-variation- and random-dopant-induced static noise margin fluctuation in nanoscale CMOS and FinFET SRAM cells

    Li, T. Y., Hwang, C. H. & Li, Y.-M., 2009, 2009 1st Asia Symposium on Quality Electronic Design, ASQED 2009. p. 24-27 4 p. 5206305. (2009 1st Asia Symposium on Quality Electronic Design, ASQED 2009).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    5 Scopus citations
  • Propagation delay dependence on channel fins and geometry aspect ratio of 16-nm multi-gate MOSFET inverter

    Cheng, H. W., Hwang, C. H. & Li, Y.-M., Jul 2009, 2009 1st Asia Symposium on Quality Electronic Design, ASQED 2009. p. 122-125 4 p. 5206287. (2009 1st Asia Symposium on Quality Electronic Design, ASQED 2009).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    10 Scopus citations
  • Reflectance of sub-wavelength structure on silicon nitride for solar cell application

    Sahoo, K. C., Li, Y.-M., Chang, E. Y., Lin, M. K. & Huang, J. H., 1 Dec 2009, SISPAD 2009 - 2009 International Conference on Simulation of Semiconductor Processes and Devices. 5290233. (International Conference on Simulation of Semiconductor Processes and Devices, SISPAD).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Statistical analysis of metal gate workfunction variability, process variation, and random dopant fluctuation in nano-CMOS circuits

    Hwang, C. H., Li, T. Y., Han, M. H., Lee, K. F., Cheng, H. W. & Li, Y.-M., Sep 2009, SISPAD 2009 - 2009 International Conference on Simulation of Semiconductor Processes and Devices. p. 399-102 3 p. 5290239. (International Conference on Simulation of Semiconductor Processes and Devices, SISPAD).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    7 Scopus citations
  • 2008

    A dynamic competition analysis on the personal computer shipments in Taiwan using lotka-volterra model

    Chiang, S. Y., Wong, G. G., Li, Y.-M. & Yu, H. C., Dec 2008, Proceedings of the 3rd IEEE Asia-Pacific Services Computing Conference, APSCC 2008. IEEE Computer Society, p. 1412-1417 6 p. 4780877. (Proceedings of the 3rd IEEE Asia-Pacific Services Computing Conference, APSCC 2008).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    2 Scopus citations
  • Comprehensive examination of threshold voltage fluctuations in nanoscale planar MOSFET and bulk FinFET devices

    Hwang, C. H., Cheng, H. W., Yeh, T. C., Li, T. Y., Huang, H. M. & Li, Y.-M., Jun 2008, Technical Proceedings of the 2008 NSTI Nanotechnology Conference and Trade Show, NSTI-Nanotech, Nanotechnology 2008. p. 647-650 4 p. (Technical Proceedings of the 2008 NSTI Nanotechnology Conference and Trade Show, NSTI-Nanotech, Nanotechnology 2008; vol. 3).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Field emission dependence on nanogap separation in surface conduction electron-emitter display

    Li, Y.-M., Kuo, Y. T., Lo, H. Y., Cheng, H. W., Yeh, T. C., Hwang, C. H., Chiang, M. T. & Mo, C. N., 2008, 2008 8th IEEE Conference on Nanotechnology, IEEE-NANO. p. 81-84 4 p. 4617013. (2008 8th IEEE Conference on Nanotechnology, IEEE-NANO).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    1 Scopus citations
  • High-frequency characteristic optimization of heterojunction bipolar transistors

    Li, Y.-M., Chen, Y. C. & Hwang, C. H., Jun 2008, Technical Proceedings of the 2008 NSTI Nanotechnology Conference and Trade Show, NSTI-Nanotech, Nanotechnology 2008. p. 615-618 4 p. (Technical Proceedings of the 2008 NSTI Nanotechnology Conference and Trade Show, NSTI-Nanotech, Nanotechnology 2008; vol. 3).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Large-scale atomistic approach to random-dopant-induced characteristic variability in nanoscale CMOS digital and high-frequency integrated circuits

    Li, Y.-M., Hwang, C. H., Yeh, T. C. & Li, T. Y., 2008, 2008 IEEE/ACM International Conference on Computer-Aided Design Digest of Technical Papers, ICCAD 2008. p. 278-285 8 p. 4681586. (IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    16 Scopus citations
  • Low turn-on voltage and high focus capability for field emission display

    Kuo, Y. T., Lo, H. Y. & Li, Y., Jun 2008, Technical Proceedings of the 2008 NSTI Nanotechnology Conference and Trade Show, NSTI-Nanotech, Nanotechnology 2008. p. 88-91 4 p. (Technical Proceedings of the 2008 NSTI Nanotechnology Conference and Trade Show, NSTI-Nanotech, Nanotechnology 2008; vol. 3).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Modeling and simulation of market dynamics for successive generation of flash memory

    Li, Y.-M. & Chiang, S. Y., 7 Jan 2008, 2007 International Conference on Convergence Information Technology, ICCIT 2007. p. 1668-1673 6 p. 4420492. (2007 International Conference on Convergence Information Technology, ICCIT 2007).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    5 Scopus citations