Projects per year
Personal profile
Research Interests
Wafer bonding
Patterned sapphire wafer
III-V epitaxial technology
Optoelectronic semiconductor components
Education/Academic qualification
PhD, Materials Science and Engineering, Stanford University
External positions
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Dive into the research topics where Yew-Chung Sermon Wu is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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製作氮化鎵／鑽石單晶基板好用在高頻與高功率氮化鎵元件
1/08/22 → 31/07/23
Project: Government Ministry › Other Government Ministry Institute
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Improving The Brightness of GaN LED And UVC AlN LED By AlN Buffer And Modified Patterned Sapphire Substrates
1/08/19 → 28/02/21
Project: Government Ministry › Other Government Ministry Institute
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Fabrication of High Brightness LED Through Laser Lift-off GaN Epilayer Grown on Patterned Sapphire Substrate
1/08/18 → 31/12/19
Project: Government Ministry › Other Government Ministry Institute
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Diamond Compoite Substrate for Device Thermoangement
1/08/17 → 31/10/18
Project: Government Ministry › Other Government Ministry Institute
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Fabrication of High Brightness LED Through Laser Lift-off GaN Epilayer Grown on Patterned Sapphire Substrate
1/08/17 → 31/12/18
Project: Government Ministry › Other Government Ministry Institute
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Au@Cu2O core@shell nanocrystals as sustainable catalysts for efficient hydrogen production from ammonia borane
Fang, M. J., Lin, Y. C., Jan, J. Y., Lai, T. H., Hsieh, P. Y., Kuo, M. Y., Chiu, Y. H., Tsao, C. W., Chen, Y. A., Wang, Y. T., Hong, Y. J., Wu, J. Y., Wu, Y. C. S., Lin, Y. G., Chang, T. F. M., Chen, C. Y., Sone, M., Chang, S. M., Chang, C. L. & Hsu, Y. J., 5 May 2023, In: Applied Catalysis B: Environmental. 324, 122198.Research output: Contribution to journal › Article › peer-review
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Investigation of ZnO/V2O5 hybrid nanocomposite-based ultraviolet photodetector and hydrogen gas sensor
Huang, W. C., Lin, Y. H., Zhang, Y. H., Chang, C. W., Wang, D. Y., Chuang, C. C., Huang, Y. H., Lin, T. C., Wu, Y. C. S. & Chen, H., Feb 2023, In: Journal of Materials Science: Materials in Electronics. 34, 5, 398.Research output: Contribution to journal › Article › peer-review
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An Evaluation for Quality Inspection of Epitaxial Layer and Heavily-doped 4H-SiC Substrate by Simple Schottky Barrier Diode and MOS Capacitor
Chu, K. W., Tseng, C. W., Tsui, B. Y., Wu, Y. C. S., Yang, C. J. & Hsu, C., 2022, 2022 IEEE 34th International Conference on Microelectronic Test Structures, ICMTS 2022 - Proceedings. Institute of Electrical and Electronics Engineers Inc., (IEEE International Conference on Microelectronic Test Structures; vol. 2022-March).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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Annealing effects on electrical property depth profiles of BF2 and P implanted polycrystalline Si determined by differential hall effect metrology
Lee, F. Y., Wu, Y. C. S., Joshi, A., Basol, B. M., Chang, C. H. & Lin, K. L., 2022, (Accepted/In press) In: Journal of Materials Science: Materials in Electronics.Research output: Contribution to journal › Article › peer-review
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Fabrication and Characterizations of PbZrxTi1-xO3 (PZT) Ultrasonic Sensing Chips
Lee, M. L., Chen, S. M., Jhang, J. J., Lu, L. S., Yang, S. T., Chiu, P. E., Tsai, Y. S., Wu, Y. C. S., Cheng, C. C., Chen, H. & Han, J., 2022, (Accepted/In press) In: IEEE Access.Research output: Contribution to journal › Article › peer-review
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