Personal profile
Research Interests
Power GaN and SiC semiconductor devices
Sub-5 nm beyond CMOS
Reliability evaluation and degradation mechanism analysis
AI-assisted device design and reliability prediction in advanced semiconductor technologies
Experience
2024.08 – present Associate Professor, Institute of Electronics, NYCU
2024.08 – present Associate Professor, Department of Electronics and Electrical Engineering, NYCU
2023.08 – present Editor, Scientific Reports (Nature Journal)
2023.01 – present IEEE EDS Technical Committees on Compound Semiconductor Devices & Circuits
2023.01 – present IEEE EDS Technical Committees on Compact Modeling
2023.01 – present Distinguished Research Fellow, Industrial Technology Research Institute
2022.08 – present Joint Professor, Undergraduate Program of Nano science and Engineering, NYCU
2022.02 – present Joint Professor, Industrial Academy Innovation School, NYCU
2021.10 – present Executive Director, MOST “Next-generation compound semiconductor technologies”
2021.11 – present Trustee, Taiwan ESD Association
2019.09 – present Seeded Trainer, Center of Higher Education Accreditation for Teaching (HEAT)
2021.08 – present Associate Professor, International College of Semiconductor Technology, NYCU
2017.08 – present MediaTek Junior Chair Professor
2022.08 – 2023.02 Vice Dean, International College of Semiconductor Technology, NYCU
2021.02 – 2021.07 Assistant Professor, International College of Semiconductor Technology, NYCU
2017.02 – 2021.01 Assistant Professor, International College of Semiconductor Technology, NCTU
2016.08 – 2017.01 Research Scientist, Imec, Leuven, Belgium
2011.09 – 2016.07 Ph.D. researcher, Imec, Leuven, Belgium
2016.01 – 2016.03 Visiting researcher, IBM, NY, USA
Education/Academic qualification
PhD, Electrical Engineering, KU Leuven
External positions
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Collaborations and top research areas from the last five years
Projects
- 7 Finished
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下世代高可靠度氮化鎵電子元件:矽製程兼容超越1000V氮化鎵功率元件開發、應用於太空惡劣環境氮化鎵功率元件探索及整合機器學習加速元件特性及可靠度優化(4/5)
Wu, T.-L. (PI)
1/02/22 → 31/01/23
Project: Government Ministry › Other Government Ministry Institute
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Next-generation Reliable GaN Electronics: CMOS Compatible Beyond 1000V GaN-on-Si Devices, Exploration Of The GaN Power Devices For Space Applications, And Machine Learning To Accelerate The Optimization Of The Characteristics And Reliability
Wu, T.-L. (PI)
1/02/21 → 31/01/22
Project: Government Ministry › Other Government Ministry Institute
-
Next-generation Reliable GaN Electronics: CMOS Compatible Beyond 1000V GaN-on-Si Devices, Exploration Of The GaN Power Devices For Space Applications, And Machine Learning To Accelerate The Optimization Of The Characteristics And Reliability
Wu, T.-L. (PI)
1/02/20 → 31/01/21
Project: Government Ministry › Other Government Ministry Institute
-
Next-generation Reliable GaN Electronics: CMOS Compatible Beyond 1000V GaN-on-Si Devices, Exploration of the GaN Power Devices for Space Applications, and Machine Learning to Accelerate the Optimization of the Characteristics and Reliability
Wu, T.-L. (PI)
1/02/19 → 31/01/20
Project: Government Ministry › Other Government Ministry Institute
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高壓高電流晶體閘流器之研究
Wu, T.-L. (PI)
1/01/19 → 30/04/19
Project: Government Ministry › Other Government Ministry Institute
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Compact GaN-Based DCFL Amplifier With Direct-Coupled Loads for Wide-Temperature Applications
Singh, S. K., Singh Chauhan, Y. & Wu, T. L., 2026, In: Ieee Electron Device Letters. 47, 2, p. 273-276 4 p.Research output: Contribution to journal › Article › peer-review
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Impacts of Annealing Temperature on Performance and Reliability of Morphotropic Phase Boundary (MPB) in HZO
Liu, H. Y., Peng, W. C., Yu, C. Y., Lin, C. Y. & Wu, T. L., 2026, In: IEEE Transactions on Electron Devices. 73, 1, p. 318-324 7 p.Research output: Contribution to journal › Article › peer-review
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A Comparative Analysis of Direct Leakage Current Compensation and Positive-Up-Negative-Down in the Characterization of Leaky Ferroelectric Structures
Tan, T. T., Wu, T. L., Liu, H. Y., Yu, C. Y., Grenouillet, L., Torraca, P. L., Padovani, A., Puglisi, F. M., Raghavan, N. & Pey, K. L., 2025, 9th IEEE Electron Devices Technology and Manufacturing Conference: Shaping the Future with Innovations in Devices and Manufacturing, EDTM 2025. Institute of Electrical and Electronics Engineers Inc., (9th IEEE Electron Devices Technology and Manufacturing Conference: Shaping the Future with Innovations in Devices and Manufacturing, EDTM 2025).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
Open Access -
A Physics-Based SPICE Compact Model for β-Ga2O3 Schottky Barrier Diode (SBD) Aiming at Circuit Design: A Demonstration Through Modeling of AC Rectification Characteristics
Singh, S. K., Chu, B. N., Lam, K. H., Huang, M. Y., Chen, H. M., Yen, C. H., Chauhan, Y. S. & Wu, T. L., 2025, In: IEEE Transactions on Electron Devices. 72, 11, p. 5892-5899 8 p.Research output: Contribution to journal › Article › peer-review
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Comprehensive Analysis of DC, Pulsed, and RF Performance of Submicron GaN-on-Si MIS-HEMTs Under Gamma Radiation
Johari, A., Su, C. Y., Chao, D. S., Gupta, A., Singh, R. & Wu, T. L., 2025, 2025 IEEE International Reliability Physics Symposium, IRPS 2025 - Proceedings. Institute of Electrical and Electronics Engineers Inc., (IEEE International Reliability Physics Symposium Proceedings).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
2 Scopus citations