Projects per year
Personal profile
Research Interests
Power GaN and SiC semiconductor devices
Sub-5 nm beyond CMOS
Reliability evaluation and degradation mechanism analysis
AI-assisted device design and reliability prediction in advanced semiconductor technologies
Experience
2024.08 – present Associate Professor, Institute of Electronics, NYCU
2024.08 – present Associate Professor, Department of Electronics and Electrical Engineering, NYCU
2023.08 – present Editor, Scientific Reports (Nature Journal)
2023.01 – present IEEE EDS Technical Committees on Compound Semiconductor Devices & Circuits
2023.01 – present IEEE EDS Technical Committees on Compact Modeling
2023.01 – present Distinguished Research Fellow, Industrial Technology Research Institute
2022.08 – present Joint Professor, Undergraduate Program of Nano science and Engineering, NYCU
2022.02 – present Joint Professor, Industrial Academy Innovation School, NYCU
2021.10 – present Executive Director, MOST “Next-generation compound semiconductor technologies”
2021.11 – present Trustee, Taiwan ESD Association
2019.09 – present Seeded Trainer, Center of Higher Education Accreditation for Teaching (HEAT)
2021.08 – present Associate Professor, International College of Semiconductor Technology, NYCU
2017.08 – present MediaTek Junior Chair Professor
2022.08 – 2023.02 Vice Dean, International College of Semiconductor Technology, NYCU
2021.02 – 2021.07 Assistant Professor, International College of Semiconductor Technology, NYCU
2017.02 – 2021.01 Assistant Professor, International College of Semiconductor Technology, NCTU
2016.08 – 2017.01 Research Scientist, Imec, Leuven, Belgium
2011.09 – 2016.07 Ph.D. researcher, Imec, Leuven, Belgium
2016.01 – 2016.03 Visiting researcher, IBM, NY, USA
Education/Academic qualification
PhD, Electrical Engineering, KU Leuven
External positions
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Collaborations and top research areas from the last five years
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Projects
- 7 Finished
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下世代高可靠度氮化鎵電子元件:矽製程兼容超越1000V氮化鎵功率元件開發、應用於太空惡劣環境氮化鎵功率元件探索及整合機器學習加速元件特性及可靠度優化(4/5)
Wu, T.-L. (PI)
1/02/22 → 31/01/23
Project: Government Ministry › Other Government Ministry Institute
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Next-generation Reliable GaN Electronics: CMOS Compatible Beyond 1000V GaN-on-Si Devices, Exploration Of The GaN Power Devices For Space Applications, And Machine Learning To Accelerate The Optimization Of The Characteristics And Reliability
Wu, T.-L. (PI)
1/02/21 → 31/01/22
Project: Government Ministry › Other Government Ministry Institute
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Next-generation Reliable GaN Electronics: CMOS Compatible Beyond 1000V GaN-on-Si Devices, Exploration Of The GaN Power Devices For Space Applications, And Machine Learning To Accelerate The Optimization Of The Characteristics And Reliability
Wu, T.-L. (PI)
1/02/20 → 31/01/21
Project: Government Ministry › Other Government Ministry Institute
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Next-generation Reliable GaN Electronics: CMOS Compatible Beyond 1000V GaN-on-Si Devices, Exploration of the GaN Power Devices for Space Applications, and Machine Learning to Accelerate the Optimization of the Characteristics and Reliability
Wu, T.-L. (PI)
1/02/19 → 31/01/20
Project: Government Ministry › Other Government Ministry Institute
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高壓高電流晶體閘流器之研究
Wu, T.-L. (PI)
1/01/19 → 30/04/19
Project: Government Ministry › Other Government Ministry Institute
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A Self-Consistent Approach Based on Bayesian Deconvolution for Trapping Time Constant Analysis: A Demonstration to Analyze ΔVTHTransients in p-GaN Gate Power HEMTs
Singh, S. K., Wu, T. L. & Chauhan, Y. S., 1 Mar 2024, In: IEEE Transactions on Electron Devices. 71, 3, p. 1820-1826 7 p.Research output: Contribution to journal › Article › peer-review
2 Scopus citations -
Dynamic On-Resistance and Threshold Voltage Instability Evaluation Circuit for Power GaN HEMTs Devices
Kumar, R. & Wu, T. L., 1 Sep 2024, In: IEEE Transactions on Industrial Electronics. 71, 9, p. 11706-11709 4 p.Research output: Contribution to journal › Article › peer-review
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Gate Leakage Current Analysis using Bayesian Deconvolution for Accurate Electron/Hole Trapping Characterizations in 4H-SiC MOSFETs
Singh, S. K., Wu, T. L. & Chauhan, Y. S., 2024, IEEE Electron Devices Technology and Manufacturing Conference: Strengthening the Globalization in Semiconductors, EDTM 2024. Institute of Electrical and Electronics Engineers Inc., (IEEE Electron Devices Technology and Manufacturing Conference: Strengthening the Globalization in Semiconductors, EDTM 2024).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
1 Scopus citations -
Heteroepitaxially grown homojunction gallium oxide PN diodes using ion implantation technologies
Huang, C. Y., Tsai, X. Y., Tarntair, F. G., Langpoklakpam, C., Ngo, T. S., Wang, P. J., Kao, Y. C., Hsiao, Y. K., Tumilty, N., Kuo, H. C., Wu, T. L., Hsiao, C. L. & Horng, R. H., Jun 2024, In: Materials Today Advances. 22, 100499.Research output: Contribution to journal › Article › peer-review
Open Access2 Scopus citations -
Investigation of DC Characteristics in GaN-on-Si power MIS-HEMTs over a Wide Temperature Range (4 K to 550 K) for Space and Quantum Computing Applications
Johari, A., Tsai, M. C., Thang, T. N. M., Yang, Y., Wu, T. L., Gupta, A. & Singh, R., 2024, IEEE Electron Devices Technology and Manufacturing Conference: Strengthening the Globalization in Semiconductors, EDTM 2024. Institute of Electrical and Electronics Engineers Inc., (IEEE Electron Devices Technology and Manufacturing Conference: Strengthening the Globalization in Semiconductors, EDTM 2024).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review