明道 柯

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Ming-Dou Ker

Professor

 https://orcid.org/0000-0003-3622-181X
Calculated based on number of publications stored in Pure and citations from Scopus
Calculated based on number of publications stored in Pure and citations from Scopus
Calculated based on number of publications stored in Pure and citations from Scopus
1991 …2024

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  • 2007

    ESD protection design for Giga-Hz high-speed I/O interfaces in a 130-nm CMOS process

    Hsiao, Y. W., Ker, M.-D., Chiu, P. Y., Huang, C. & Tseng, Y. K., 1 Dec 2007, Proceedings - 20th Anniversary IEEE International SOC Conference. p. 277-280 4 p. 4545474. (Proceedings - 20th Anniversary IEEE International SOC Conference).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    2 Scopus citations

  • Failure of on-chip power-rail ESD clamp circuits during system-level ESD test

    Yen, C. C. & Ker, M.-D., 2007, 2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual. p. 598-599 2 p. 4227710. (Annual Proceedings - Reliability Physics (Symposium)).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    13 Scopus citations

  • Impact of gate tunneling leakage on performances of phase locked loop circuit in nanoscale CMOS technology

    Chen, J. S. & Ker, M.-D., 2007, 2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual. p. 664-665 2 p. 4227743. (Annual Proceedings - Reliability Physics (Symposium)).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    2 Scopus citations

  • Latehup-like failure of power-rail ESD clamp circuits in CMOS integrated circuits under system-level ESD test

    Ker, M.-D. & Yen, C. C., 2007, IEEE International Symposium on Electromagnetic Compatibility, EMC 2007. 4305743. (IEEE International Symposium on Electromagnetic Compatibility).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

  • Low-capaeitance SCR with waffle layout structure for on-chip ESD protection in RF ICs

    Lin, C. Y. & Ker, M.-D., 2 Oct 2007, Proceedings of the 2007 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2007. p. 749-752 4 p. 4266539. (Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    12 Scopus citations

  • On-panel analog output buffer for data driver with consideration of device characteristic variation in LTPS technology

    Li, Y. H., Ker, M.-D., Huang, C. Y. & Hsu, C. Y., Mar 2007, AD'07 - Proceedings of Asia Display 2007. p. 210-215 6 p. (AD'07 - Proceedings of Asia Display 2007; vol. 1).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    2 Scopus citations

  • On-panel electrostatic discharge (ESD) protection design with thin-film transistor in LTPS process

    Ker, M.-D., Chuang, J. Y., Deng, C. K., Kuo, C. H., Li, C. H., Lai, M. S., Wang, C. W. & Liu, C. T., Mar 2007, AD'07 - Proceedings of Asia Display 2007. p. 551-556 6 p. (AD'07 - Proceedings of Asia Display 2007; vol. 1).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    1 Scopus citations

  • Optimization of PMOS-triggered SCR devices for on-chip ESD protection in a 0.18-μm CMOS technology

    Chen, S. H. & Ker, M.-D., 1 Dec 2007, Proceedings of the 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2007. p. 245-248 4 p. 4378093. (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    4 Scopus citations

  • Test structure on SCR device in waffle layout for RF ESD protection

    Ker, M.-D. & Lin, C. Y., 27 Sep 2007, 2007 IEEE International Conference on Microelectronic Test Structures, ICMTS - Conference Proceedings. p. 196-199 4 p. 4252432. (IEEE International Conference on Microelectronic Test Structures).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    5 Scopus citations

  • The impact of N-drift implant on ESD robustness of high-voltage NMOS with embedded SCR structure in 40-V CMOS process

    Chang, W. J., Ker, M.-D., Lai, T. X., Tang, T. H. & Su, K. C., 1 Dec 2007, Proceedings of the 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2007. p. 249-252 4 p. 4378094. (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    1 Scopus citations

  • Transient-induced latchup in CMOS integrated circuits due to Electrical Fast Transient (EFT) test

    Yen, C. C. & Ker, M.-D., 2007, Proceedings of the 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2007. p. 253-256 4 p. 4378095. (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    5 Scopus citations

  • Ultra low-capacitance bond pad for RF applications in CMOS technology

    Hsiao, Y. W. & Ker, M.-D., 2 Oct 2007, Proceedings of the 2007 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2007. p. 303-306 4 p. 4266436. (Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    4 Scopus citations

  • Unexpected failure in power-rail ESD clamp circuits of CMOS integrated circuits in microelectronics systems during electrical fast transient (EFT) test and the re-design solution

    Ker, M.-D. & Yen, C. C., 1 Dec 2007, Proceedings of the 18th International Zurich Symposium on Electromagnetic Compatibility, EMC. p. 69-72 4 p. 4388198. (Proceedings of the 18th International Zurich Symposium on Electromagnetic Compatibility, EMC).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    7 Scopus citations
  • 2006

    Abnormal ESD damages occur in interface circuits between different power domains in ND-mode MM ESD stress

    Hung, H. P., Ker, M.-D., Chen, S. H. & Chuang, C. H., 1 Dec 2006, Proceedings of 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2006. p. 163-166 4 p. 4017046. (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    6 Scopus citations

  • circuit performance degradation of sample-and-hold amplifier due to gate-oxide overstress in a 130-nm cmos process

    Chen, J. S. & Ker, M.-D., 1 Dec 2006, 2006 IEEE International Reliability Physics Symposium Proceedings, 44th Annual. p. 705-706 2 p. 4017275. (IEEE International Reliability Physics Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    4 Scopus citations

  • Dependence of layout parameters on CDE (Cable Discharge Event) robustness of CMOS devices in A 0.25-μM salicided CMOS process

    Ker, M.-D. & Lai, T. X., 1 Dec 2006, 2006 IEEE International Reliability Physics Symposium Proceedings, 44th Annual. p. 633-634 2 p. 4017239. (IEEE International Reliability Physics Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    5 Scopus citations

  • Design on LVDS receiver with new delay-selecting technique for UXGA flat panel display applications

    Ker, M.-D. & Wu, C. H., 2006, ISCAS 2006: 2006 IEEE International Symposium on Circuits and Systems, Proceedings. p. 5155-5158 4 p. 1693793. (Proceedings - IEEE International Symposium on Circuits and Systems).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    6 Scopus citations

  • Design on new tracking circuit of I/O buffer in 0.13-μm cell library for mixed-voltage application

    Chen, Z. P., Chuang, C. H. & Ker, M.-D., 2006, ISCAS 2006: 2006 IEEE International Symposium on Circuits and Systems, Proceedings. p. 2213-2216 4 p. 1693059. (Proceedings - IEEE International Symposium on Circuits and Systems).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    1 Scopus citations

  • Dummy-gate structure to improve ESD robustness in a fully-salicided 130-nm CMOS technology without using extra salicide-blocking mask

    Hsu, H. C. & Ker, M.-D., 1 Dec 2006, Proceedings - 7th International Symposium on Quality Electronic Design, ISQED 2006. p. 503-506 4 p. 1613186. (Proceedings - International Symposium on Quality Electronic Design, ISQED).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    2 Scopus citations

  • ESD (Electrostatic Discharge) protection design for nanoelectronics in CMOS technology

    Ker, M.-D., 2006, Advanced Signal Processing, Circuits, and System Design Techniques for Communications - 2006 IEEE International Symposium on Circuits and Systems, ISCAS 2006. p. 217-279 63 p. 4016442. (Advanced Signal Processing, Circuits, and System Design Techniques for Communications - 2006 IEEE International Symposium on Circuits and Systems, ISCAS 2006).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    6 Scopus citations

  • ESD protection design for CMOS integrated circuits with mixed-voltage I/O interfaces

    Chang, W. J. & Ker, M.-D., 1 Dec 2006, PRIME 2006: 2nd Conference on Ph.D. Research in MicroElectronics and Electronics - Proceedings. p. 305-308 4 p. 1689957. (PRIME 2006: 2nd Conference on Ph.D. Research in MicroElectronics and Electronics - Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

  • ESD protection for mixed-voltage I/O in low- voltage thin-oxide CMOS

    Ker, M.-D., Chang, W. J., Wang, C. T. & Chen, W. Y., 1 Dec 2006, 2006 IEEE International Solid-State Circuits Conference, ISSCC - Digest of Technical Papers. 1696284. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    12 Scopus citations

  • ESD robustness of 40-V CMOS devices with/without drift implant

    Chang, W. J., Ker, M.-D., Lai, T. H., Tang, T. H. & Su, K. C., 1 Dec 2006, 2006 IEEE International Integrated Reliability Workshop Final Report, IIRW. p. 167-170 4 p. 4098714. (IEEE International Integrated Reliability Workshop Final Report).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    3 Scopus citations

  • Experimental evaluation and device simulation of device structure influences on latchup immunity in high-voltage 40-V CMOS process

    Hsu, S. F., Ker, M.-D., Lin, G. L. & Jou, Y. N., 1 Dec 2006, 2006 IEEE International Reliability Physics Symposium Proceedings, 44th Annual. p. 140-144 5 p. 4017147. (IEEE International Reliability Physics Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    2 Scopus citations

  • Gate-oxide reliability on CMOS analog amplifiers in a 130-nm low-voltage CMOS processes

    Chen, J. S. & Ker, M.-D., 2006, Proceedings of 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2006. p. 45-48 4 p. 4017019. (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    4 Scopus citations

  • Investigation on RF characteristics of stacked P-I-N polysilicon diodes for ESD protection design in 0.18-μm CMOS technology

    Shiu, Y. D., Chuang, C. H. & Ker, M.-D., 2006, 2006 International Symposium on VLSI Technology, Systems, and Applications, VLSI-TSA - Proceedings of Technical Papers. p. 56-57 2 p. 4016600. (International Symposium on VLSI Technology, Systems, and Applications, Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    1 Scopus citations

  • Low-power wordline voltage generator for low-voltage flash memory

    Wang, T. M., Ker, M.-D., Yeh, S. & Chang, Y. C., 2006, ICECS 2006 - 13th IEEE International Conference on Electronics, Circuits and Systems. p. 220-223 4 p. 4263343. (Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    3 Scopus citations

  • Method to evaluate cable discharge event (CDE) reliability of integrated circuits in CMOS technology

    Lai, T. X. & Ker, M.-D., 1 Dec 2006, Proceedings - 7th International Symposium on Quality Electronic Design, ISQED 2006. p. 597-602 6 p. 1613203. (Proceedings - International Symposium on Quality Electronic Design, ISQED).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    6 Scopus citations

  • New matching methodology of low-noise amplifier with ESD protection

    Huang, B. S. & Ker, M.-D., 1 Dec 2006, ISCAS 2006: 2006 IEEE International Symposium on Circuits and Systems, Proceedings. p. 4891-4894 4 p. 1693727. (Proceedings - IEEE International Symposium on Circuits and Systems).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    12 Scopus citations

  • On-chip ESD protection strategies for RF circuits in CMOS technology

    Ker, M. D. & Hsiao, Y. W., 2006, ICSICT-2006: 2006 8th International Conference on Solid-State and Integrated Circuit Technology, Proceedings. IEEE Computer Society, p. 1680-1683 4 p. 4098510. (ICSICT-2006: 2006 8th International Conference on Solid-State and Integrated Circuit Technology, Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    4 Scopus citations

  • On-chip transient detection circuit for system-level ESD protection in CMOS ICs

    Ker, M.-D., Yen, C. C. & Shih, P. C., 2006, Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, CICC 2006. p. 361-364 4 p. 4114979. (Proceedings of the Custom Integrated Circuits Conference).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    5 Scopus citations

  • Study of board-level noise filters to prevent transient-induced latchup in CMOS integrated circuits During EMC/ESD test

    Hsu, S. F. & Ker, M.-D., 21 Nov 2006, 17th International Zurich Symposium on Electromagnetic Compatibility, 2006. p. 533-536 4 p. 1629679. (17th International Zurich Symposium on Electromagnetic Compatibility, 2006; vol. 2006).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

  • System-level ESD protection design with on-chip transient detection circuit

    Yen, C. C., Ker, M.-D. & Shih, P. C., 2006, ICECS 2006 - 13th IEEE International Conference on Electronics, Circuits and Systems. p. 616-619 4 p. 4263442. (Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

  • The impact of inner pickup on ESD robustness of multi-finger NMOS in nanoscale CMOS technology

    Ker, M.-D. & Hsu, H. C., 2006, 2006 IEEE International Reliability Physics Symposium Proceedings, 44th Annual. p. 631-632 2 p. 4017238. (IEEE International Reliability Physics Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    16 Scopus citations
  • 2005

    Dependences of damping frequency and damping factor of bi-polar trigger waveforms on transient-induced latchup

    Hsu, S. F. & Ker, M.-D., Sep 2005, 2005 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2005. 5271811. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    1 Scopus citations

  • Design on power-rail ESD clamp circuit for 3.3-V I/O interface by using only 1-V/2.5-V low-voltage devices in a 130-NM CMOS process

    Ker, M.-D., Chen, W. Y. & Hsu, K. C., 2005, 2005 IEEE International Reliability Physics Symposium Proceedings, 43rd Annual. p. 606-607 2 p. (IEEE International Reliability Physics Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    6 Scopus citations

  • ESD protection design for mixed-voltage I/O interfaces - Overview

    Ker, M. D. & Lin, K. H., 1 Jan 2005, 2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC. Institute of Electrical and Electronics Engineers Inc., p. 493-498 6 p. 1635316. (2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    1 Scopus citations

  • ESD protection design with The Low-Leakage-Current Diode String for RF circuits in BiCMOS SiGe process

    Ker, M.-D. & Wu, W. L., Sep 2005, 2005 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2005. 7 p. 5271826. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    1 Scopus citations

  • Evaluation on board-level noise filter networks to suppress transient-induced latchup under system-level ESD test

    Ker, M.-D. & Hsu, S. F., Sep 2005, 2005 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2005. 8 p. 5271753. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    1 Scopus citations

  • Evaluation on efficient measurement setup for transient-induced latchup with BI-polar trigger

    Ker, M.-D. & Hsu, S. F., 15 Dec 2005, 2005 IEEE International Reliability Physics Symposium Proceedings, 43rd Annual. p. 121-128 8 p. (IEEE International Reliability Physics Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    14 Scopus citations

  • Impact of mosfet gate-oxide reliability on CMOS operational amplifiers in a 130-nm low-voltage CMOS process

    Chen, J. S. & Ker, M.-D., 2005, 2005 IEEE International Reliability Physics Symposium Proceedings, 43rd Annual. p. 423-430 8 p. (IEEE International Reliability Physics Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    7 Scopus citations

  • Initial-on BSD protection design with PMO S-triggered SCR device

    Ker, M. D. & Chen, S. H., 1 Jan 2005, 2005 IEEE Asian Solid-State Circuits Conference, ASSCC 2005. IEEE Computer Society, p. 105-108 4 p. 4017542. (2005 IEEE Asian Solid-State Circuits Conference, ASSCC 2005).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    3 Scopus citations

  • Methodology to evaluate the robustness of integrated circuits under Cable Discharge Event

    Lai, T. X. & Ker, M. D., 2005, 2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC. Institute of Electrical and Electronics Engineers Inc., p. 499-502 4 p. 1635317. (2005 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    2 Scopus citations

  • Methods to improve machine-model ESD robustness of NMOS devices in fully-salicided CMOS technology

    Hsu, H. C., Chen, C. M. & Ker, M.-D., 31 Oct 2005, 2005 IEEE VLSI-TSA - International Symposium on VLSI Technology - VLSI-TSA - TECH, Proceedings of Technical Papers. p. 19-20 2 p. T13. (2005 IEEE VLSI-TSA - International Symposium on VLSI Technology - VLSI-TSA-TECH, Proceedings of Technical Papers).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    1 Scopus citations

  • On-chip high-voltage charge pump circuit in standard CMOS processes with polysilicon diodes

    Ker, M. D. & Chen, S. L., 1 Jan 2005, 2005 IEEE Asian Solid-State Circuits Conference, ASSCC 2005. IEEE Computer Society, p. 157-160 4 p. 4017555. (2005 IEEE Asian Solid-State Circuits Conference, ASSCC 2005).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    9 Scopus citations

  • Self-Substrate-triggered technique to enhance turn-on uniformity of multi-finger ESD protection devices

    Ker, M.-D., Chen, J. H. & Hsu, K. C., 31 Oct 2005, 2005 IEEE VLSI-TSA - International Symposium on VLSI Technology - VLSI-TSA - TECH, Proceedings of Technical Papers. p. 17-18 2 p. T12. (2005 IEEE VLSI-TSA - International Symposium on VLSI Technology - VLSI-TSA-TECH, Proceedings of Technical Papers).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    11 Scopus citations
  • 2004

    A new output buffer for 3.3-V PCI-X application in a 0.13-μm 1/2.5-V CMOS process

    Chen, S. L. & Ker, M.-D., 1 Dec 2004, Proceedings of 2004 IEEE Asia-Pacific Conference on Advanced System Integrated Circuits. p. 112-115 4 p. (Proceedings of 2004 IEEE Asia-Pacific Conference on Advanced System Integrated Circuits).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    7 Scopus citations

  • Design on latchup-free power-rail ESD clamp circuit in high-voltage CMOS ICs

    Lin, K. H. & Ker, M.-D., 1 Dec 2004, 2004 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD '04. 5272601. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    13 Scopus citations

  • Design to avoid the over-gate-driven effect on ESD protection circuits in deep-submicron CMOS processes

    Ker, M.-D. & Chen, W. Y., 2004, Proceedings - 5th International Symposium on Quality Electronic Design, ISQUED 2004. IEEE Computer Society, p. 445-450 6 p. (Proceedings - 5th International Symposium on Quality Electronic Design, ISQUED 2004).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    14 Scopus citations

  • Latchup test-induced failure within ESD protection diodes in a high-voltage CMOS IC product

    Lin, I. C., Chao, C. J., Ker, M.-D., Tseng, J. C., Hsu, C. T., Leu, L. Y., Chen, Y. L., Tsai, C. K. & Huang, R. W., 2004, 2004 Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD '04. 5272617. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    3 Scopus citations