Calculated based on number of publications stored in Pure and citations from Scopus
Calculated based on number of publications stored in Pure and citations from Scopus
Calculated based on number of publications stored in Pure and citations from Scopus
1991 …2024

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  • 2010

    ESD protection circuit for high-voltage CMOS ICs with improved immunity against transient-induced latchup

    Ker, M-D., Hsu, C. L. & Chen, W. Y., 2010, ISCAS 2010 - 2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems. p. 989-992 4 p. 5537378. (ISCAS 2010 - 2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    10 Scopus citations
  • ESD protection design for differential low-noise amplifier with cross-coupled SCR

    Lin, C. Y., Ker, M-D. & Hsiao, Y. W., 20 Aug 2010, 2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010. p. 39-42 4 p. 5510294. (2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    1 Scopus citations
  • ESD protection design for low trigger voltage and high latch-up immunity

    Tseng, J. C., Hsu, C. T., Tsai, C. K., Liao, Y. C. & Ker, M-D., 15 Sep 2010, IPFA 2010 - 17th International Symposium on the Physical and Failure Analysis of Integrated Circuits. 5532307. (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    4 Scopus citations
  • ESD protection design with lateral DMOS transistor in 40-V BCD technology

    Wang, C. T., Ker, M-D., Tang, T. H. & Su, K. C., 2010, IPFA 2010 - 17th International Symposium on the Physical and Failure Analysis of Integrated Circuits. 5532308. (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    5 Scopus citations
  • Impact of layout pickups to ESD robustness of MOS transistors in sub 100-nm CMOS process

    Ker, M-D., Wen, Y. R., Chen, W. Y. & Lin, C. Y., 1 Dec 2010, 2010 International Symposium on Next-Generation Electronics, ISNE 2010 - Conference Program. p. 100-103 4 p. 5669188. (2010 International Symposium on Next-Generation Electronics, ISNE 2010 - Conference Program).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    11 Scopus citations
  • Implementation of the cosine law for location awareness system

    Lin, P. J., Huang, Y. C., Huang, Y. J. & Ker, M-D., 20 Dec 2010, PrimeAsia 2010 - 2nd Asia Pacific Conference on Postgraduate Research in Microelectronics and Electronics. p. 255-258 4 p. 5604912. (PrimeAsia 2010 - 2nd Asia Pacific Conference on Postgraduate Research in Microelectronics and Electronics).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    2 Scopus citations
  • Layout optimization on ESD diodes for giga-Hz RF and high-speed I/O circuits

    Yeh, C. T., Liang, Y. C. & Ker, M-D., 8 Nov 2010, Proceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010. p. 241-244 4 p. 5496734. (Proceedings of 2010 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2010).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    2 Scopus citations
  • Modeling the parasitic capacitance of ESD protection SCR to Co-design matching network in RF ICs

    Lin, C. Y. & Ker, M-D., 2010, 2010 International Symposium on Next-Generation Electronics, ISNE 2010 - Conference Program. p. 104-107 4 p. 5669189. (2010 International Symposium on Next-Generation Electronics, ISNE 2010 - Conference Program).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • New transient detection circuit for Electrical Fast Transient (EFT) protection design in display panels

    Ker, M-D., Lin, W. Y., Yen, C. C., Yang, C. M., Chen, T. Y. & Chen, S. F., 20 Aug 2010, 2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010. p. 51-54 4 p. 5510297. (2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    7 Scopus citations
  • On-chip ESD detection circuit for system-level ESD protection design

    Ker, M-D., Lin, W. Y., Yen, C. C., Yang, C. M., Chen, T. Y. & Chen, S. F., 1 Dec 2010, ICSICT-2010 - 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology, Proceedings. p. 1584-1587 4 p. 5667447. (ICSICT-2010 - 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology, Proceedings).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    9 Scopus citations
  • Optimized layout on ESD protection diode with low parasitic capacitance

    Yeh, C. T. & Ker, M-D., 1 Dec 2010, ICSICT-2010 - 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology, Proceedings. p. 1701-1703 3 p. 5667306. (ICSICT-2010 - 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology, Proceedings).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    2 Scopus citations
  • Protection design against system-level ESD transient disturbance on display panels

    Ker, M-D., Lin, W. Y., Yen, C. C., Yang, C. M., Chen, T. Y. & Chen, S. F., 2 Aug 2010, 2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010. p. 438-441 4 p. 5475821. (2010 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2010).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    3 Scopus citations
  • Self-matched ESD cell in CMOS technology for 60-GHz broadband RF applications

    Lin, C. Y., Chu, L. W., Ker, M-D., Lu, T. H., Hung, P. F. & Li, H. C., 16 Jul 2010, Proceedings of the 2010 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2010. p. 573-576 4 p. 10.1109/RFIC.2010.5477291. (Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    15 Scopus citations
  • 2009

    Chip-level and board-level CDM ESD tests on IC products

    Ker, M-D., Huang, C. K., Hsiao, Y. W. & Hsieh, Y. F., 2009, Proceedings of the 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2009. p. 45-49 5 p. 5232702. (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    1 Scopus citations
  • Circuit solutions on ESD protection design for mixed-voltage I/O buffers in nanoscale CMOS

    Ker, M-D. & Wang, C. T., 1 Dec 2009, 2009 IEEE Custom Integrated Circuits Conference, CICC '09. p. 689-696 8 p. 5280728. (Proceedings of the Custom Integrated Circuits Conference).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    3 Scopus citations
  • Design of 2xVDD-tolerant I/O buffer with 1xVDD CMOS devices

    Ker, M-D. & Lin, Y. L., 2009, 2009 IEEE Custom Integrated Circuits Conference, CICC '09. p. 539-542 4 p. 5280763. (Proceedings of the Custom Integrated Circuits Conference).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    12 Scopus citations
  • Design of on-chip power-rail ESD clamp circuit with ultra-small capacitance to detect ESD transition

    Chen, S. H. & Ker, M-D., 1 Dec 2009, 2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09. p. 327-330 4 p. 5158161. (2009 International Symposium on VLSI Design, Automation and Test, VLSI-DAT '09).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    3 Scopus citations
  • Improvement on ESD robustness of lateral DMOS in high-voltage CMOS ICs by body current injection

    Chen, W. Y., Ker, M-D., Jou, Y. N., Huang, Y. J. & Lin, G. L., 26 Oct 2009, 2009 IEEE International Symposium on Circuits and Systems, ISCAS 2009. p. 385-388 4 p. 5117766. (Proceedings - IEEE International Symposium on Circuits and Systems).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    12 Scopus citations
  • Low-leakage electrostatic discharge protection circuit in 65-nm fully-silicided CMOS technology

    Wang, C. T., Ker, M-D., Tang, T. H. & Su, K. C., 1 Dec 2009, 2009 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2009. p. 21-24 4 p. 5166256. (2009 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2009).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • New layout scheme to improve ESD robustness of I/O buffers in fully-silicided CMOS process

    Ker, M-D., Chen, W. Y., Shieh, W. T. & Wei, I. J., Nov 2009, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2009, EOS/ESD 2009. 5340148. (Electrical Overstress/Electrostatic Discharge Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    2 Scopus citations
  • On the design of power-rail ESD clamp circuit with consideration of gate leakage current in 65-nm low-voltage CMOS process

    Ker, M-D., Chiu, P. Y., Tsai, F. Y. & Chang, Y. J., 2009, 2009 IEEE International Symposium on Circuits and Systems, ISCAS 2009. p. 2281-2284 4 p. 5118254. (Proceedings - IEEE International Symposium on Circuits and Systems).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    15 Scopus citations
  • Source-side engineering to increase holding voltage of LDMOS in a O.5-m 16-V BCD technology to avoid latch-up failure

    Chen, W. Y., Ker, M-D., Jou, Y. N., Huang, Y. J. & Lin, G. L., 16 Nov 2009, Proceedings of the 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2009. p. 41-44 4 p. 5232701. (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    16 Scopus citations
  • Transient-to-digital converter for protection design in CMOS integrated circuits against electrical fast transient

    Yen, C. C., Ker, M-D., Liao, C. S., Chen, T. Y. & Tsai, C. C., 1 Dec 2009, 2009 IEEE International Symposium on Electromagnetic Compatibility, EMC 2009. p. 41-44 4 p. 5284683. (IEEE International Symposium on Electromagnetic Compatibility).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    1 Scopus citations
  • Ultra-low-leakage power-rail ESD clamp circuit in nanoscale low-voltage CMOS process

    Chiu, P. Y., Ker, M-D., Tsai, F. Y. & Chang, Y. J., 2009, 2009 IEEE International Reliability Physics Symposium, IRPS 2009. p. 750-753 4 p. 5173343. (IEEE International Reliability Physics Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    13 Scopus citations
  • 2008

    2xVDD-tolerant crystal oscillator circuit realized with 1xVDD CMOS devices without gate-oxide reliability issue

    Ker, M-D., Wang, T. M. & Liao, H. T., 19 Sep 2008, 2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008. p. 820-823 4 p. 4541544. (Proceedings - IEEE International Symposium on Circuits and Systems).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    1 Scopus citations
  • CDM ESD protection in CMOS integrated circuits

    Ker, M-D. & Hsiao, Y. W., Sep 2008, Proceedings of the Argentine School of Micro-Nanoelectronics, Technology and Applications 2008, EAMTA. p. 61-66 6 p. 4638978. (Proceedings of the Argentine School of Micro-Nanoelectronics, Technology and Applications 2008, EAMTA).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    4 Scopus citations
  • Design on mixed-voltage I/O buffers with slew-rate control in low-voltage CMOS process

    Ker, M-D., Wang, T. M. & Hu, F. L., 26 Dec 2008, Proceedings of the 15th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2008. p. 1047-1050 4 p. 4675036. (Proceedings of the 15th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2008).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    17 Scopus citations
  • ESD protection design for fully integrated CMOS RF power amplifiers with waffle-structured SCR

    Ker, M-D., Lin, C. Y. & Meng, G. X., 19 Sep 2008, 2008 IEEE International Symposium on Circuits and Systems, ISCAS 2008. p. 1292-1295 4 p. 4541662. (Proceedings - IEEE International Symposium on Circuits and Systems).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    3 Scopus citations
  • ESD protection design for RF circuits in CMOS technology with low-c implementation

    Lin, C. Y. & Ker, M-D., Mar 2008, Semiconductor Technology, ISTC 2008 - Proceedings of the 7th International Conference on Semiconductor Technology. p. 70-75 6 p. (Proceedings - Electrochemical Society; vol. PV 2008-1).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • High-robust ESD protection structure with embedded SCR in high-voltage CMOS process

    Lai, T. H., Ker, M-D., Chang, W. J., Tang, T. H. & Su, K. C., 2008, 46th Annual 2008 IEEE International Reliability Physics Symposium Proceedings, IRPS. p. 627-628 2 p. 4558959. (IEEE International Reliability Physics Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    9 Scopus citations
  • Measurement on snapback holding voltage of high-voltage LDMOS for latch-up consideration

    Chen, W. Y., Ker, M-D., Huang, Y. J., Jou, Y. N. & Lin, G. L., 2008, Proceedings of APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems. p. 61-64 4 p. 4745960. (IEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    14 Scopus citations
  • Mechanism of snapback failure induced by the latch-up test in high-voltage CMOS integrated circuits

    Tseng, J. C., Chen, Y. L., Hsu, C. T., Tsai, F. Y., Chen, P. A. & Ker, M-D., 17 Sep 2008, 46th Annual 2008 IEEE International Reliability Physics Symposium Proceedings, IRPS. p. 625-626 2 p. 4558958. (IEEE International Reliability Physics Symposium Proceedings).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    3 Scopus citations
  • New transient detection circuit for system-level ESD protection

    Yen, C. C., Liao, C. S. & Ker, M-D., 2008, 2008 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT. p. 180-183 4 p. 4542442. (2008 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    5 Scopus citations
  • On-glass digital-to-analog converter with gamma correction for panel data driver

    Wang, T. M., Li, Y. H. & Ker, M-D., 26 Dec 2008, Proceedings of the 15th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2008. p. 202-205 4 p. 4674826. (Proceedings of the 15th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2008).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    5 Scopus citations
  • Optimization on NMOS-based power-rail ESD clamp circuits with gate-driven mechanism in a 0.13-μm CMOS technology

    Chen, S. H. & Ker, M-D., 2008, Proceedings of the 15th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2008. p. 666-669 4 p. 4674941. (Proceedings of the 15th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2008).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    8 Scopus citations
  • Optimization on SCR device with low capacitance for on-chip ESD protection in UWB RF circuits

    Lin, C. Y. & Ker, M-D., 23 Sep 2008, 2008 15th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA. 4588154. (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Transient-to-digital converter for ESD protection design in microelectronic systems

    Ker, M-D., Yen, C. C., Liao, C. S., Chen, T. Y. & Tsai, C. C., 2008, Proceedings of 2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008. p. 409-412 4 p. 4708814. (Proceedings of 2008 IEEE Asian Solid-State Circuits Conference, A-SSCC 2008).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    2 Scopus citations
  • 2007

    A new architecture for charge pump circuit without suffering gate-oxide reliability in low-voltage CMOS processes

    Wang, T. M., Shen, W. Y. & Ker, M-D., 1 Dec 2007, ICECS 2007 - 14th IEEE International Conference on Electronics, Circuits and Systems. p. 206-209 4 p. 4510966. (Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Automation of synchronous bias transmission line pulsing system

    Chang, B. W., Hsu, H. C. & Ker, M-D., 28 Sep 2007, 2007 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2007 - Proceedings of Technical Papers. 4239446. (2007 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2007 - Proceedings of Technical Papers).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    1 Scopus citations
  • Board level ESD of driver ICs on LCD panels

    Hsu, C. T., Tseng, J. C., Chen, Y. L., Tsai, F. Y., Yu, S. H., Chen, P. A. & Ker, M-D., 25 Sep 2007, 2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual. p. 590-591 2 p. 4227706. (Annual Proceedings - Reliability Physics (Symposium)).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    4 Scopus citations
  • CMOS power amplifier with ESD protection design merged in matching network

    Shiu, Y. D., Huang, B. S. & Ker, M-D., 1 Dec 2007, ICECS 2007 - 14th IEEE International Conference on Electronics, Circuits and Systems. p. 825-828 4 p. 4511118. (Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    6 Scopus citations
  • Design of 2xVDD-tolerant I/O buffer with considerations of gate-oxide reliability and hot-carrier degradation

    Tsai, H. W. & Ker, M-D., 1 Dec 2007, ICECS 2007 - 14th IEEE International Conference on Electronics, Circuits and Systems. p. 1240-1243 4 p. 4511221. (Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    11 Scopus citations
  • Design of high-voltage-tolerant power-rail ESD clamp circuit in low-voltage CMOS processes

    Ker, M-D., Wang, C. T., Tang, T. H. & Su, K. C., 25 Sep 2007, 2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual. p. 594-595 2 p. 4227708. (Annual Proceedings - Reliability Physics (Symposium)).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    5 Scopus citations
  • Design on mixed-voltage I/O buffers with consideration of hot-carrier reliability

    Ker, M-D. & Hu, F. L., 28 Sep 2007, 2007 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2007 - Proceedings of Technical Papers. 4239397. (2007 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2007 - Proceedings of Technical Papers).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    12 Scopus citations
  • ESD protection design for Giga-Hz high-speed I/O interfaces in a 130-nm CMOS process

    Hsiao, Y. W., Ker, M-D., Chiu, P. Y., Huang, C. & Tseng, Y. K., 1 Dec 2007, Proceedings - 20th Anniversary IEEE International SOC Conference. p. 277-280 4 p. 4545474. (Proceedings - 20th Anniversary IEEE International SOC Conference).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    2 Scopus citations
  • Failure of on-chip power-rail ESD clamp circuits during system-level ESD test

    Yen, C. C. & Ker, M-D., 2007, 2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual. p. 598-599 2 p. 4227710. (Annual Proceedings - Reliability Physics (Symposium)).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    13 Scopus citations
  • Impact of gate tunneling leakage on performances of phase locked loop circuit in nanoscale CMOS technology

    Chen, J. S. & Ker, M-D., 2007, 2007 IEEE International Reliability Physics Symposium Proceedings, 45th Annual. p. 664-665 2 p. 4227743. (Annual Proceedings - Reliability Physics (Symposium)).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    2 Scopus citations
  • Latehup-like failure of power-rail ESD clamp circuits in CMOS integrated circuits under system-level ESD test

    Ker, M-D. & Yen, C. C., 2007, IEEE International Symposium on Electromagnetic Compatibility, EMC 2007. 4305743. (IEEE International Symposium on Electromagnetic Compatibility).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

  • Low-capaeitance SCR with waffle layout structure for on-chip ESD protection in RF ICs

    Lin, C. Y. & Ker, M-D., 2 Oct 2007, Proceedings of the 2007 IEEE Radio Frequency Integrated Circuits Symposium, RFIC 2007. p. 749-752 4 p. 4266539. (Digest of Papers - IEEE Radio Frequency Integrated Circuits Symposium).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    12 Scopus citations
  • On-panel analog output buffer for data driver with consideration of device characteristic variation in LTPS technology

    Li, Y. H., Ker, M-D., Huang, C. Y. & Hsu, C. Y., Mar 2007, AD'07 - Proceedings of Asia Display 2007. p. 210-215 6 p. (AD'07 - Proceedings of Asia Display 2007; vol. 1).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    2 Scopus citations