Keyphrases
Testing Method
57%
Fault Model
44%
IR Drop
39%
Neural Network
29%
Process Variation
29%
Multi-threshold CMOS (MTCMOS)
27%
Convolutional Neural Network
27%
Cell-Aware Test
26%
Power Distribution Network
26%
Parts per Million
26%
Compactor
24%
Wafer
24%
Power Switch
23%
Subthreshold SRAM
21%
Machine Learning Techniques
19%
Router
19%
Process Technology
19%
Result-oriented
18%
Pattern Information
18%
Model Fitting
18%
Novel Object Recognition
18%
Cell-based
17%
EDRAM
17%
CMOS Design
16%
SRAM Design
16%
Industrial Design
16%
Global Routing
15%
Defect Pattern
15%
Observation Window
15%
Obstacle Avoidance
15%
Rectilinear Steiner Tree
15%
Defective Parts
15%
Design Flow
15%
Array-based
15%
Return Materials Authorization
15%
Test Quality
14%
System Testing
14%
Timing Optimization
14%
Local Processes
13%
Bridging Faults
13%
MetaFormer
13%
Fault Test
13%
Test Escape
12%
Fitting Method
12%
Faulty Behavior
12%
Clustering Methods
11%
Training Time
11%
Monte Carlo Tree Search
11%
Wafer Patterns
11%
Ring Oscillator
11%
Computer Science
Experimental Result
100%
Product Design
28%
Convolutional Neural Network
26%
Power Distribution Network
26%
Process Variation
25%
Test Algorithm
25%
Neural Network
23%
Research Effort
21%
Machine Learning Technique
18%
Power Consumption
16%
Supply Voltage
16%
Transition Signal
15%
Global Routing
15%
Fault Coverage
15%
Field Programmable Gate Arrays
15%
Observation Window
15%
Machine Learning
15%
Learning System
15%
Timing Analysis
14%
Timing Optimization
14%
Information Pattern
13%
Tree Search
12%
Prediction Model
12%
Speed-up
11%
Training Sample
11%
Design Technique
11%
Buffer Insertion
10%
Criticality
10%
Electronic Design Automation
10%
Scan Chain
10%
Test Data Volume
10%
Random Decision Forest
10%
Analytical Model
10%
de-noising
10%
Routing Congestion
10%
Arbitrary Size
10%
Reinforcement Learning
10%
Design Complexity
10%
Physical Design
8%
Integrated Circuit
8%
Case Study
7%
Timing Constraint
7%
Test Generation
7%
Memory Design
7%
Research Topic
7%
Training Dataset
7%
Learning Framework
7%
Design Procedure
7%
Threshold Voltage
7%
Domain Circuit
7%
Engineering
Experimental Result
52%
Fault Model
48%
Test Method
32%
Test Structure
30%
Process Variation
28%
Test Time
27%
Product Design
23%
Compactor
21%
Machine Learning Technique
15%
Field Programmable Gate Arrays
15%
Power Distribution
15%
Electric Power Distribution
15%
Frame Time
15%
Convolutional Neural Network
15%
Design Flow
15%
SPICE
15%
Nodes
13%
Observables
12%
Metrics
11%
Oscillator
11%
Fits and Tolerances
11%
Critical Path
10%
Gate Oxide
10%
Testing Method
10%
Total Profit
10%
Electronic Design Automation
10%
Random Access Memory
10%
Thin-Film Transistor
10%
Estimation Scheme
10%
Artificial Neural Network
10%
Design Change
10%
Random Forest
7%
Electric Power Utilization
7%
Binary Search
7%
Electromigration
7%
Automatic Test Pattern Generation
7%
Cell Design
7%
Cell Pair
7%
Boolean Operation
6%
Spatial Correlation
6%
Core Model
6%
Design Technique
6%
Supply Voltage
5%
Operating Mode
5%
Functional Test
5%
Chip Process
5%
VLSI Circuits
5%
Design Parameter
5%
Optimal Placement
5%
Quality Control
5%
