Keyphrases
Testing Method
59%
Fault Model
45%
Process Variation
30%
IR Drop
29%
Multi-threshold CMOS (MTCMOS)
29%
Convolutional Neural Network
29%
Cell-Aware Test
27%
Compactor
25%
Power Switch
23%
Subthreshold SRAM
22%
Machine Learning Techniques
20%
Process Technology
19%
Result-oriented
19%
Neural Network
19%
Model Fitting
19%
Novel Object Recognition
18%
Cell-based
18%
EDRAM
17%
CMOS Design
17%
SRAM Design
17%
Industrial Design
16%
Power Distribution Network
16%
Global Routing
16%
Parts per Million
16%
Design Flow
16%
Array-based
16%
Test Quality
15%
System Testing
14%
Wafer
14%
Local Processes
14%
Bridging Faults
13%
Fault Test
13%
Fitting Method
12%
Faulty Behavior
12%
Clustering Methods
12%
Ring Oscillator
11%
Technology Node
11%
Short Defect
11%
Process Variation Monitoring
11%
Stochastic Regression
11%
Probability-based Approach
11%
Shift Power
11%
Test Cubes
11%
Scan Cell Reordering
11%
Violation Prediction
11%
Statistical Timing Analysis
11%
Variance-based
11%
Dynamic IR
11%
Test Flow
11%
Gate Oxide Short
11%
Engineering
Experimental Result
54%
Fault Model
50%
Test Method
33%
Test Structure
31%
Process Variation
30%
Test Time
28%
Product Design
24%
Compactor
22%
Machine Learning Technique
16%
Field Programmable Gate Arrays
16%
Power Distribution
16%
Electric Power Distribution
16%
Frame Time
16%
Convolutional Neural Network
16%
Design Flow
16%
SPICE
16%
Nodes
13%
Observables
13%
Metrics
12%
Oscillator
11%
Fits and Tolerances
11%
Critical Path
11%
Gate Oxide
11%
Testing Method
11%
Total Profit
11%
Electronic Design Automation
11%
Random Access Memory
11%
Thin-Film Transistor
11%
Estimation Scheme
11%
Artificial Neural Network
11%
Design Change
11%
Random Forest
8%
Electric Power Utilization
8%
Binary Search
7%
Electromigration
7%
Cell Design
7%
Cell Pair
7%
Boolean Operation
7%
Spatial Correlation
6%
Core Model
6%
Design Technique
6%
Supply Voltage
6%
Operating Mode
5%
Functional Test
5%
Chip Process
5%
VLSI Circuits
5%
Design Parameter
5%
Optimal Placement
5%
Quality Control
5%
Schematic Diagram
5%
Computer Science
Experimental Result
100%
Product Design
29%
Convolutional Neural Network
27%
Process Variation
26%
Test Algorithm
26%
Research Effort
22%
Machine Learning Technique
19%
Power Consumption
17%
Transition Signal
16%
Power Distribution Network
16%
Global Routing
16%
Fault Coverage
16%
Field Programmable Gate Arrays
16%
Machine Learning
16%
Learning System
16%
Timing Analysis
15%
Neural Network
13%
Supply Voltage
13%
Prediction Model
12%
Speed-up
12%
Training Sample
11%
Design Technique
11%
Buffer Insertion
11%
Criticality
11%
Electronic Design Automation
11%
Scan Chain
11%
Test Data Volume
11%
Random Decision Forest
11%
Analytical Model
11%
Design Complexity
10%
Physical Design
9%
Case Study
8%
Timing Constraint
8%
Memory Design
8%
Research Topic
7%
Training Dataset
7%
Learning Framework
7%
Design Procedure
7%
Threshold Voltage
7%
Domain Circuit
7%
Manhattan Distance
7%
Boolean Operation
7%
Spatial Correlation
6%
Sampling Technique
6%
Dynamic Programming
6%
Ring Oscillator
6%
Comparator
5%
Database Design
5%
Estimation Scheme
5%
Physical Design Automation
5%
