Projects per year
Personal profile
Research Interests
VLSI Testing, Statistical Timing Analysis, Physical Design Automation, Test Compression/Compaction
Experience
Education/Academic qualification
PhD, Electrical & Computer Engineering, University of California, Santa Barbara
External positions
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Recent external collaboration on country/territory level. Dive into details by clicking on the dots or
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降低客退率之機器學習技術與自動化測試向量產生方法(II)
1/08/22 → 31/07/23
Project: Government Ministry › Other Government Ministry Institute
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基於強化學習之多層障礙物排除直角史坦納最小樹繞線器
1/08/22 → 31/07/23
Project: Government Ministry › Other Government Ministry Institute
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能滿足擺放區域限制之2.5D IC裸晶擺置方法與模塊擺置後優化流程(2/2)
1/04/22 → 31/03/23
Project: Government Ministry › Other Government Ministry Institute
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降低客退率之機器學習技術與自動化測試向量產生方法(II)
1/08/24 → 31/07/25
Project: Government Ministry › Other Government Ministry Institute
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降低客退率之機器學習技術與自動化測試向量產生方法(II)
1/08/23 → 31/07/24
Project: Government Ministry › Other Government Ministry Institute
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A Reinforcement Learning Agent for Obstacle-Avoiding Rectilinear Steiner Tree Construction
Chen, P. Y., Ke, B. T., Lee, T. C., Tsai, I. C., Kung, T. W., Lin, L. Y., Liu, E. C., Chang, Y. C., Li, Y. L. & Chao, M. C. T., 13 Apr 2022, ISPD 2022 - Proceedings of the 2022 International Symposium on Physical Design. Association for Computing Machinery, p. 107-115 9 p. (Proceedings of the International Symposium on Physical Design).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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Improving Cell-Aware Test for Intra-Cell Short Defects
Lee, D. Z., Chen, Y. Y., Wu, K. C. & Chao, M. C. T., 2022, Proceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022. Bolchini, C., Verbauwhede, I. & Vatajelu, I. (eds.). Institute of Electrical and Electronics Engineers Inc., p. 436-441 6 p. (Proceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
2 Scopus citations -
Path-Based Pre-Routing Timing Prediction for Modern Very Large-Scale Integration Designs
Chen, L. W., Sui, Y. N., Lee, T. C., Li, Y. L., Chao, M. C. T., Tsai, I. C., Kung, T. W., Liu, E. C. & Chang, Y. C., 2022, Proceedings of the 23rd International Symposium on Quality Electronic Design, ISQED 2022. IEEE Computer Society, (Proceedings - International Symposium on Quality Electronic Design, ISQED; vol. 2022-April).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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Rule Generation for Classifying SLT Failed Parts
Hsu, H. C., Lu, C. C., Wang, S. W., Jones, K., Wu, K. C. & Chao, M. C. T., 2022, Proceedings - 2022 IEEE 40th VLSI Test Symposium, VTS 2022. IEEE Computer Society, (Proceedings of the IEEE VLSI Test Symposium; vol. 2022-April).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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Test Methodology for Defect-Based Bridge Faults
Chang, S. W., Nien, Y. T., Hu, Y. P., Wu, K. C., Wang, C. C., Huang, F. S., Tang, Y. L., Chen, Y. C., Chen, M. C. & Chao, M. C. T., 2022, (Accepted/In press) In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems.Research output: Contribution to journal › Article › peer-review