Projects per year
Personal profile
Research Interests
VLSI Testing, Statistical Timing Analysis, Physical Design Automation, Test Compression/Compaction
Experience
Education/Academic qualification
PhD, Electrical & Computer Engineering, University of California, Santa Barbara
External positions
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Collaborations and top research areas from the last five years
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降低客退率之機器學習技術與自動化測試向量產生方法(II)
Chao, M.C.-T. (PI)
1/08/24 → 31/07/25
Project: Government Ministry › Other Government Ministry Institute
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降低客退率之機器學習技術與自動化測試向量產生方法(II)
Chao, M.C.-T. (PI)
1/08/23 → 31/07/24
Project: Government Ministry › Other Government Ministry Institute
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基於強化學習之多層障礙物排除直角史坦納最小樹繞線器
Chao, M.C.-T. (PI)
1/08/23 → 31/07/24
Project: Government Ministry › Other Government Ministry Institute
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基於強化學習之多層障礙物排除直角史坦納最小樹繞線器
Chao, M.C.-T. (PI)
1/08/22 → 31/07/23
Project: Government Ministry › Other Government Ministry Institute
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降低客退率之機器學習技術與自動化測試向量產生方法(II)
Chao, M.C.-T. (PI)
1/08/22 → 31/07/23
Project: Government Ministry › Other Government Ministry Institute
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Arbitrary-size Multi-layer OARSMT RL Router Trained with Combinatorial Monte-Carlo Tree Search
Chen, L. T., Kuo, H. R., Li, Y. L. & Chao, M. C. T., 7 Nov 2024, Proceedings of the 61st ACM/IEEE Design Automation Conference, DAC 2024. Institute of Electrical and Electronics Engineers Inc., 218. (Proceedings - Design Automation Conference).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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Identifying Good-Dice-in-Bad-Neighborhoods Using Artificial Neural Networks
Yen, C. H., Wang, T. R., Liu, C. M., Yang, C. H., Chen, C. T., Chen, Y. Y., Lee, J. N., Kao, S. Y., Wu, K. C. & Chao, M. C. T., 2024, In: IEEE Transactions on Semiconductor Manufacturing. 37, 3, p. 280-292 13 p.Research output: Contribution to journal › Article › peer-review
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IR-drop and Routing Congestion Aware PDN Refinement Framework for Timing Optimization
Chen, Y. G., Chang, H. H., Liang, Y. C., Chang, W. H., Tsai, I. C., Lin, C. W., Chang, Y. C. & Chao, M. C. T., 2024, Proceedings - International SoC Design Conference 2024, ISOCC 2024. Institute of Electrical and Electronics Engineers Inc., p. 133-134 2 p. (Proceedings - International SoC Design Conference 2024, ISOCC 2024).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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Transformer and Its Variants for Identifying Good Dice in Bad Neighborhoods
Lu, C. C., Chang, C. C., Yen, C. H., Chang, S. W., Chu, Y. H., Wu, K. C. & Chao, M. C. T., 2024, Proceedings - 2024 IEEE 42nd VLSI Test Symposium, VTS 2024. IEEE Computer Society, (Proceedings of the IEEE VLSI Test Symposium).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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Wafer-View Defect-Pattern-Prominent GDBN Method Using MetaFormer Variant
Li, S. W., Yen, C. H., Chang, S. W., Chu, Y. H., Wu, K. C. & Chao, M. C. T., 2024, Proceedings - 2024 IEEE International Test Conference, ITC 2024. Institute of Electrical and Electronics Engineers Inc., p. 76-80 5 p. (Proceedings - International Test Conference).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review